Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Dino Lenarduzzi"'
Autor:
Serge Cutillas, Bernd Valk, Nadhum Zayer, Liguo Jiang, Huixuan Hu, Qing He, Dino Lenarduzzi, Ed Wolak, Rainer K. Baettig, Tao Wang
Publikováno v:
SPIE Proceedings.
In the past decade of development in fiber laser technology, the market share of high power full fiber lasers has expanded tremendously to replace traditional gas and solid laser systems. While fiber lasers offer advantages of compact dimensions, hig
Autor:
Terry Towe, Jürgen Müller, James Harrison, Kelly Johnson, Serge Cutillas, Sang-Ki Park, Jeff Mott, Dino Lenarduzzi, Susanne Pawlik, Ed Wolak, Xu Jin, Boris Sverdlov, Touyen Nguyen, Andrea Guarino, Darning Liu, Norbert Lichtenstein, Tom Truchan, Chris Button
Publikováno v:
SPIE Proceedings.
In this work we show that mini-bar-based 8xx products show the reliability characteristics of independent emitter failures and "non-degrading" drift plots similar to those of their 9xx counterparts. This fact is in part an outcome of the bonding proc
Autor:
Irving Chyr, Darning Liu, Tom Truchan, Robert L. Miller, James Harrison, A. L. Meissner, Sang-Ki Park, Ed Wolak, Xu Jin, Hanxuan Li, Robert Bullock, Terry Towe, Serge Cutillas, Jeff Mott, Dino Lenarduzzi, Kelly Johnson
Publikováno v:
SPIE Proceedings.
Continued advances in high power diode laser technology enable new applications and enhance existing ones. Recently, mini-bar based modules have been demonstrated which combine the advantages of independent emitter failures previously shown in single
Autor:
Ed Wolak, Serge Cutillas, Xu Jin, Hanxuan Li, Kelly Johnson, James Harrison, Cameron Mitchell, Trevor Crum, Dino Lenarduzzi, Robert J. Miller, Terry Towe, Irving Chyr, Daming Liu, John Gloyd, A. L. Meissner, Sang-Ki Park, Oscar Romero
Publikováno v:
SPIE Proceedings.
High-power, packaged diode-laser sources continue to evolve through co-engineering of epitaxial design, beam conditioning and thermal management. Here we review examples of improvements made to key attributes including reliable power, brightness, pow
Publikováno v:
52nd Electronic Components & Technology Conference 2002. (Cat. No.02CH37345); 2002, p1745-1747, 3p