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pro vyhledávání: '"Dingming Xie"'
Autor:
L. Forbes, Dingming Xie
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 19:773-778
This report describes a successful simulation using HSPICE and comparison with published data of the phase noise on a 2-GHz CMOS inductance-capacitance (LC) oscillator caused by low-frequency flicker noise (1/f noise). The flicker noise, which is det
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::978f3af3d5aafc72ac9fe888e1bf0029
https://doi.org/10.1109/43.851992
https://doi.org/10.1109/43.851992
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 19:1293-1303
The two main sources of low-frequency flicker noise are mobility fluctuations and number fluctuations. Our experiments on NMOS noise measurements were done from subthreshold to saturation region of operation for both long-channel (5 /spl mu/m) and sh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::56f216c6e58db9ea319febba5d82fcf7
https://doi.org/10.1109/43.892853
https://doi.org/10.1109/43.892853
Autor:
Forbes, Leonard, Dingming Xie
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Nov2000, Vol. 19 Issue 11, p1293. 11p. 2 Black and White Photographs, 2 Charts, 12 Graphs.
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