Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Ding Wan'er"'
Publikováno v:
2020 IEEE 9th Data Driven Control and Learning Systems Conference (DDCLS).
In the solar power industry, quality inspection of solar cells is a very important part of the production and application process. Micro-crack is a type of common defect that may be present in photovoltaic (PV) module cells which can reduce the power
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6fab506b306cedcd37b1ff2c184fabba
https://doi.org/10.1109/ddcls49620.2020.9275068
https://doi.org/10.1109/ddcls49620.2020.9275068
Publikováno v:
2020 35th Youth Academic Annual Conference of Chinese Association of Automation (YAC).
Solar cells are the core module of photovoltaic (PV) modules. Defects will decrease the power efficiency of solar cells and reduce the stability of PV power systems. Electroluminescence (EL) imaging is able to image solar modules with higher resoluti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1618f9f2af9fa0781d664e4599ebb2e
https://doi.org/10.1109/yac51587.2020.9337676
https://doi.org/10.1109/yac51587.2020.9337676
Autor:
Ding Wan'er, Baojie Yan, Yuheng Zeng, Jiang Sheng, Haiyan He, Jichun Ye, Chunhui Shou, Xi Yang, Zheng Jingming, Mingdun Liao, Qingling Han
Publikováno v:
physica status solidi (a). 218:2100562
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da085e494da50153c63d563a56fa0663
https://doi.org/10.1002/pssa.202100562
https://doi.org/10.1002/pssa.202100562
Autor:
Zheng Jingming, Haiyan He, Jichun Ye, Ding Wan'er, Yiran Lin, Yuheng Zeng, Chunhui Shou, Mingdun Liao, Linna Lu, Mengmeng Feng, Yuyan Zhi, Ganghua Qin, Baojie Yan
Publikováno v:
Solar Energy Materials and Solar Cells. 223:110970
A comparison study of ultrathin atomic layer deposited AlOx, wet-chemically oxidized SiOx, and their combination as the tunnel layer in TOPCon structure with both B-doped and P-doped poly-Si contact layers on n-type c-Si wafers was carried out. The p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3da751f95003761da484b10ed455c235
https://doi.org/10.1016/j.solmat.2021.110970
https://doi.org/10.1016/j.solmat.2021.110970
Autor:
Ding Wan'er, Fu Liming, Yuheng Zeng, Luo Xijia, Xueqi Guo, Jichun Ye, Xu Jiaping, Chunhui Shou, Mingdun Liao, Baojie Yan, Cao Yuhong, Zhixue Wang, Zhe Rui, Qing Yang
Publikováno v:
Solar Energy Materials and Solar Cells. 210:110487
We present a systematic study of highly boron (B)-doped poly-silicon (p+-poly-Si) and ultrathin silicon oxide (SiOx) bi-layer structure, also named as p-TOPCon, as the hole-selective passivated contact on n-type c-Si wafer, where the SiOx layer is ma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::125f03eaa87ef4f1aeb4a5c2dbe29a52
https://doi.org/10.1016/j.solmat.2020.110487
https://doi.org/10.1016/j.solmat.2020.110487