Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Dina Medhat"'
Autor:
Gehan Ahmed, Mostafa, Hanan Mohamed, Ibrahim, Abeer, Al Sayed Shehab, Yasmin Gamal El, Gendy, Dina Medhat Mohamed, Aly, Ghada Abdel Haleem, Shousha
Publikováno v:
European Journal of Pediatrics. 181:2299-2309
Similar to hemophagocytic lymphohistiocytosis (HLH), some patients with SARS-CoV-2 have cytokine storm. Serum soluble interleukin-2 receptor (sCD25) and soluble CD163 (sCD163) are potential diagnostic biomarkers for HLH that help in guiding its treat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1e7c7683a130bdfa9df5485a9951e028
https://doi.org/10.1007/s00431-022-04398-8
https://doi.org/10.1007/s00431-022-04398-8
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 11:25-35
Electrostatic discharge (ESD) robustness is an extremely important aspect in integrated circuits (ICs) and is well established for regular 2-D ICs. However, 2.5-D and 3-D integration present new challenges in both design and verification. While sever
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::332ff43e218522a96a739972399e36d7
https://doi.org/10.1109/tcpmt.2020.3039608
https://doi.org/10.1109/tcpmt.2020.3039608
Akademický článek
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Publikováno v:
International Journal of Pharmacy and Pharmaceutical Sciences. :47-56
Objective: Bemotrizinol (BEMT) is the most efficient broad-spectrum UV-absorber having a dual mechanism of action in absorbing and reflecting photons. The main objective of this work was to develop successful oil in water (o/w) nanoemulsion for impro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8cbe7848806ef2339e59345671ef9ff8
https://doi.org/10.22159/ijpps.2019v11i7.32652
https://doi.org/10.22159/ijpps.2019v11i7.32652
Autor:
Sunsoo Byun, Matthew Hogan, Dina Medhat, Sherif Hany, Sunmi Choi, Jonathan James Muirhead, Mohamed ElRefaee, Jaehyun Jang, Hossam Sarhan, Baekryong Jeong, Hyunseung Choi
Publikováno v:
2020 IEEE International Integrated Reliability Workshop (IIRW).
The demand for both non-volatile (NAND) and volatile dynamic random access memory (DRAM) chips in processor and application-specific integrated circuit (ASIC) designs has grown tremendously in recent years, due largely to rapid advances in semiconduc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4384726b1531c2c0e1a9e05ce4ef35ed
https://doi.org/10.1109/iirw49815.2020.9312861
https://doi.org/10.1109/iirw49815.2020.9312861
Publikováno v:
ISQED
Technology evolution from conventional 2D to 3D integrated circuits (ICs) has faced many challenges, among them electrostatic discharge (ESD) protection device design and verification. Several studies have addressed ESD device design for 3D ICs. Howe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c9390f5492607a5886a943f0fc4c4324
https://doi.org/10.1109/isqed48828.2020.9137046
https://doi.org/10.1109/isqed48828.2020.9137046
Publikováno v:
Progress In Electromagnetics Research M. 23:123-137
We introduce an electromagnetic investigation of the complex experimental setup used in studying the Ratchet Efiect at low temperature. This investigation, based on intensive electromagnetic simulations, shows that a compromise has to be taken into c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::398d20b9b18d5893d2fe61de674de07e
https://doi.org/10.2528/pierm11120606
https://doi.org/10.2528/pierm11120606
Publikováno v:
ASP-DAC
Design constraints describe the intent of IC designers when developing electronic circuits. Constraints from, e.g., electrical and thermal domains are transformed into corresponding physical constraints for layout design. Physical constraints can als
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f4dd37935bc29fa18f12d8f907b7473
https://doi.org/10.1109/aspdac.2015.7059047
https://doi.org/10.1109/aspdac.2015.7059047
Autor:
Vincent Bligny, Dina Medhat, Sophie Billy, Mark Hofmann, Ziyang Lu, Didier Chollat-Namy, J. Lescot
Publikováno v:
ISLPED
This paper presents a transistor-level verification flow to detect electrical overstress, static leakage and ESD-CDM issues in large low power SoC circuits. With innovative features like Spice patterns recognition and static voltage propagation by Ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f353fdfd45601f505ba827dac4667ad
https://doi.org/10.1145/2333660.2333694
https://doi.org/10.1145/2333660.2333694
Publikováno v:
2009 4th International Design and Test Workshop (IDT).
In this paper, we describe a methodology for the efficient extraction and model order reduction of large on-chip interconnects. We propose a methodology that results in simulation time reduction by at least an order of magnitude, compared to commerci
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b275f3e6d48ad6153f0bc0ae3efd3a07
https://doi.org/10.1109/idt.2009.5404152
https://doi.org/10.1109/idt.2009.5404152