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Autor:
Vasily Gushenets, Alexey S. Bugaev, Frank Wessel, V. I. Pershin, A. VanDrie, B. M. Johnson, V. A. Batalin, G. Yu. Yushkov, N. Debolt, N. Rostoker, S. V. Petrenko, Timur Kulevoy, R. P. Kuibeda, Ady Hershcovitch, F. Patton, A. A. Kolomiets, Dimitri Seleznev, Efim Oks
Publikováno v:
Emerging Applications of Vacuum-Arc-Produced Plasma, Ion and Electron Beams ISBN: 9781402010668
Recently substantial enhancement of high ion charge states was clearly observed in both the HCEI and ITEP E-MEVVA ion sources. These experimental setups have two different methods of measuring the ion charge state distributions. The results can be co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aec31f5a6326832e61a40c47ca1158bb
https://doi.org/10.1007/978-94-010-0277-6_5
https://doi.org/10.1007/978-94-010-0277-6_5