Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Dilip Wadhwani"'
Autor:
Amitabh Dube, Abhishek Agarwal, C. L. Nawal, Kapil Gupta, Meenu Bagarhatta, Prakash Keswani, Vishal Gupta, Vidyadhar Singh, Jitendra Gupta, Sudhir Bhandari, Ajeet Singh, Amit Talk, Raman Sharma, Shivankan Kakkar, Dilip Wadhwani, Subrata Banerjee, Govind Rankawat, Sunil Mahavar
Publikováno v:
SSRN Electronic Journal.
Purpose: The present study was undertaken to investigate imaging features of emerging COVID-19 pneumonia by chest ultrasound (POCUS) and digital radiographs (Ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83283573b1eb128430be4f3003547eba
https://doi.org/10.2139/ssrn.3588540
https://doi.org/10.2139/ssrn.3588540
Autor:
Renu, Saigal, Laxmi Kant, Goyal, Abhishek, Agrawal, Dilip, Wadhwani, Pradeep, Mittal, R N, Yadav, P D, Meena
Publikováno v:
The Journal of the Association of Physicians of India. 62(8)
Methaemoglobinaemia due to nitrite poisoning is rare. Awareness of this condition in the cyanosed patient not responding to oxygenation and timely administration of methylene blue may be life saving. We report a case of methaemoglobinaemia as a resul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::e1fb8b8c1ece7a448699a09baaad18f0
https://pubmed.ncbi.nlm.nih.gov/25856950
https://pubmed.ncbi.nlm.nih.gov/25856950
Publikováno v:
SPIE Proceedings.
Improvements in defect reduction of semiconductor processes and equipment have realized higher wafer sorts yield but have typically limited analysis and inspection of the edge of wafers by several millimeters. Sort yield on production wafers has been
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9608f8e75c5c8aae8340f89adc89ae38
https://doi.org/10.1117/12.221443
https://doi.org/10.1117/12.221443