Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Dietrich PM"'
Autor:
Dietrich PM; SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin, Germany., Kjærvik M; Bundesanstalt für Materialforschung und -prüfung, 12200 Berlin, Germany., Willneff EA; School of Design, University of Leeds, Leeds LS2 9JT, United Kingdom., Unger WES; Bundesanstalt für Materialforschung und -prüfung, 12200 Berlin, Germany.
Publikováno v:
Biointerphases [Biointerphases] 2022 May 04; Vol. 17 (3), pp. 031002. Date of Electronic Publication: 2022 May 04.
Autor:
Kjærvik M; Surface Analysis and Interfacial Chemistry, Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, Germany., Ramstedt M; Department of Chemistry, Umeå University, Umeå, Sweden., Schwibbert K; Surface Analysis and Interfacial Chemistry, Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, Germany., Dietrich PM; SPECS Surface Nano Analysis GmbH, Berlin, Germany., Unger WES; Surface Analysis and Interfacial Chemistry, Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, Germany.
Publikováno v:
Frontiers in chemistry [Front Chem] 2021 Apr 30; Vol. 9, pp. 666161. Date of Electronic Publication: 2021 Apr 30 (Print Publication: 2021).
Autor:
Hahn MB; Institut für Experimentalphysik, Freie Universität Berlin, Berlin, Germany. hahn@physik.fu-berlin.de.; Bundesanstalt für Materialforschung und -prüfung, Berlin, Germany. hahn@physik.fu-berlin.de., Dietrich PM; SPECS Surface Nano Analysis GmbH, Berlin, Germany., Radnik J; Bundesanstalt für Materialforschung und -prüfung, Berlin, Germany.
Publikováno v:
Communications chemistry [Commun Chem] 2021 Apr 09; Vol. 4 (1), pp. 50. Date of Electronic Publication: 2021 Apr 09.
Autor:
Dietrich PM; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Unger WE; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Swaraj S; Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin-BP 48, 91192 Gif-sur-YVETTE Cedex, France.
Publikováno v:
Biointerphases [Biointerphases] 2016 Oct 28; Vol. 11 (4), pp. 04B402. Date of Electronic Publication: 2016 Oct 28.
Autor:
Belsey NA; National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK., Cant DJ; National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK., Minelli C; National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK., Araujo JR; Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Divisão de Metrologia de Materiais (Dimat) Avenida Nossa Senhora das Graças, 50 Duque de Caxias, RJ 25250-020, Brazil., Bock B; Tascon GmbH, Mendelstr. 17, D-48149 Münster, Germany., Brüner P; ION-TOF GmbH, Heisenbergstr. 15, 48149 Münster, Germany., Castner DG; National ESCA and Surface Analysis Center for Biomedical Problems, Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, WA 98195-1653, USA., Ceccone G; European Commission Joint Research Centre, Institute for Health and Consumer Protection, Nanobiosciences Unit, Via E. Fermi 2749, 21027 Ispra, Italy., Counsell JD; Kratos Analytical Ltd., Wharfside, Trafford Wharf Road, Manchester M17 1GP, UK., Dietrich PM; BAM Federal Institute for Materials Research and Testing (BAM 6.1), Unter den Eichen 44-46, D-12203 Berlin, Germany., Engelhard MH; Pacific Northwest National Laboratory, EMSL, Richland, WA 99352, USA., Fearn S; Department of Materials, Imperial College London, South Kensington Campus, London SW7 2AZ, UK., Galhardo CE; Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Divisão de Metrologia de Materiais (Dimat) Avenida Nossa Senhora das Graças, 50 Duque de Caxias, RJ 25250-020, Brazil., Kalbe H; Kratos Analytical Ltd., Wharfside, Trafford Wharf Road, Manchester M17 1GP, UK., Won Kim J; Korea Research Institute of Standards and Science, 267 Gajeong-ro, Daejeon 34113, Korea., Lartundo-Rojas L; Instituto Politécnico Nacional, Centro de Nanociencias y Micro y Nanotecnologías, UPALM, Zacatenco, México D.F. CP. 07738, México., Luftman HS; Surface Analysis Facility, Lehigh University, 7 Asa Drive, Bethlehem, PA 18015. USA., Nunney TS; Thermo Fisher Scientific, Unit 24, The Birches Industrial Estate, Imberhorne Lane, East Grinstead, West Sussex, RH19 1UB, UK., Pseiner J; Institut fuer Angewandte Physik, TU Vienna, Wiedner Hauptstr 8-10, A 1040 Vienna, Austria., Smith EF; Nanoscale and Microscale Research Centre, School of Chemistry, University of Nottingham, University Park, Nottingham NG7 2RD, UK., Spampinato V; National ESCA and Surface Analysis Center for Biomedical Problems, Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, WA 98195-1653, USA., Sturm JM; Industrial Focus Group XUV Optics, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE Enschede, the Netherlands., Thomas AG; School of Materials and Photon Science Institute, University of Manchester, Manchester, M13 9PL, UK., Treacy JP; Thermo Fisher Scientific, Unit 24, The Birches Industrial Estate, Imberhorne Lane, East Grinstead, West Sussex, RH19 1UB, UK., Veith L; Tascon GmbH, Mendelstr. 17, D-48149 Münster, Germany., Wagstaffe M; School of Materials and Photon Science Institute, University of Manchester, Manchester, M13 9PL, UK., Wang H; National Institute of Metrology, Beijing 100029, P. R. China., Wang M; National Institute of Metrology, Beijing 100029, P. R. China., Wang YC; ION-TOF GmbH, Heisenbergstr. 15, 48149 Münster, Germany., Werner W; Institut fuer Angewandte Physik, TU Vienna, Wiedner Hauptstr 8-10, A 1040 Vienna, Austria., Yang L; Department of Chemistry, Xi'an-Jiaotong Liverpool University, Suzhou, China., Shard AG; National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK.
Publikováno v:
The journal of physical chemistry. C, Nanomaterials and interfaces [J Phys Chem C Nanomater Interfaces] 2016 Oct 27; Vol. 120 (42), pp. 24070-24079. Date of Electronic Publication: 2016 Sep 13.
Autor:
Dietrich PM; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Nietzold C; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Weise M; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Unger WE; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Alnabulsi S; Physical Electronics, Inc., 17825 Lake Drive East, Chanhassen, Minnesota 55317., Moulder J; Physical Electronics, Inc., 17825 Lake Drive East, Chanhassen, Minnesota 55317.
Publikováno v:
Biointerphases [Biointerphases] 2016 Jun 02; Vol. 11 (2), pp. 029603. Date of Electronic Publication: 2016 Jun 02.
Autor:
Fischer T; Bundesanstalt für Materialforschung und -prüfung (BAM) , Unter den Eichen 87, 12205 Berlin, Germany., Dietrich PM; Bundesanstalt für Materialforschung und -prüfung (BAM) , Unter den Eichen 87, 12205 Berlin, Germany., Unger WE; Bundesanstalt für Materialforschung und -prüfung (BAM) , Unter den Eichen 87, 12205 Berlin, Germany., Rurack K; Bundesanstalt für Materialforschung und -prüfung (BAM) , Unter den Eichen 87, 12205 Berlin, Germany.
Publikováno v:
Analytical chemistry [Anal Chem] 2016 Jan 19; Vol. 88 (2), pp. 1210-7. Date of Electronic Publication: 2016 Jan 04.
Autor:
Dietrich PM; Bundesanstalt für Materialforschung und -prüfung (BAM) , Unter den Eichen 87, 12205 Berlin, Germany., Streeck C; Physikalisch-Technische Bundesanstalt (PTB) , Abbestr. 2-12, 10587 Berlin, Germany., Glamsch S; Bundesanstalt für Materialforschung und -prüfung (BAM) , Unter den Eichen 87, 12205 Berlin, Germany.; Institut für Chemie und Biochemie, Freie Universität Berlin , Fabeckstr. 34/36, 14195 Berlin, Germany., Ehlert C; Bundesanstalt für Materialforschung und -prüfung (BAM) , Unter den Eichen 87, 12205 Berlin, Germany.; Institut für Chemie, Universität Potsdam , Karl-Liebknecht-Straße 24-25, 14476 Potsdam, Germany., Lippitz A; Bundesanstalt für Materialforschung und -prüfung (BAM) , Unter den Eichen 87, 12205 Berlin, Germany., Nutsch A; Physikalisch-Technische Bundesanstalt (PTB) , Abbestr. 2-12, 10587 Berlin, Germany., Kulak N; Institut für Chemie und Biochemie, Freie Universität Berlin , Fabeckstr. 34/36, 14195 Berlin, Germany., Beckhoff B; Physikalisch-Technische Bundesanstalt (PTB) , Abbestr. 2-12, 10587 Berlin, Germany., Unger WE; Bundesanstalt für Materialforschung und -prüfung (BAM) , Unter den Eichen 87, 12205 Berlin, Germany.
Publikováno v:
Analytical chemistry [Anal Chem] 2015 Oct 06; Vol. 87 (19), pp. 10117-24. Date of Electronic Publication: 2015 Sep 10.
Autor:
Hennig A; BAM Federal Institute for Materials Research and Testing, Richard-Willstaetter-Strasse 11, 12203 Berlin, Germany. paul.dietrich@bam.de ute.resch@bam.de., Dietrich PM, Hemmann F, Thiele T, Borcherding H, Hoffmann A, Schedler U, Jäger C, Resch-Genger U, Unger WE
Publikováno v:
The Analyst [Analyst] 2015 Mar 21; Vol. 140 (6), pp. 1804-8. Date of Electronic Publication: 2015 Feb 05.
Autor:
Fischer T; Division 1.9 Chemical and Optical Sensing, BAM Federal Institute for Materials Research and Testing , Richard-Willstätter-Strasse 11, 12489 Berlin, Germany., Dietrich PM, Streeck C, Ray S, Nutsch A, Shard A, Beckhoff B, Unger WE, Rurack K
Publikováno v:
Analytical chemistry [Anal Chem] 2015 Mar 03; Vol. 87 (5), pp. 2685-92. Date of Electronic Publication: 2015 Feb 12.