Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Dieter Schroder"'
Publikováno v:
The SHAFR Guide Online
Externí odkaz:
https://doi.org/10.1163/2468-1733_shafr_SIM180090002
Publikováno v:
ECS Transactions. 3:1211-1222
Device performance and reliability are of concern for devices fabricated on strained Si wafers. For strained Si formed by SiGe crystal growth, defects are of particular interest. We characterized such SiGe samples by pulsed MOS capacitor, gate oxide
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::697449be54a03af3aeb64d72c139f732
https://doi.org/10.1149/1.2355916
https://doi.org/10.1149/1.2355916
Publikováno v:
MRS Proceedings. 863
Electromigration tests were performed on passivated electroplated Au four terminal Kelvin line structures using the conventional in situ resistance monitoring technique. The stress conditions were a current density of 2.0 MA/cm2 with ambient temperat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f391aaf59dca6b84c4fff251167cc54
https://doi.org/10.1557/proc-863-b8.30
https://doi.org/10.1557/proc-863-b8.30
Autor:
Steve Kilgore, Dieter Schroder
Publikováno v:
ECS Meeting Abstracts. :10-10
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ad055eaa002c3d21b487e9db6422906
https://doi.org/10.1149/ma2010-01/1/10
https://doi.org/10.1149/ma2010-01/1/10
Autor:
Dieter Schroder
Publikováno v:
ECS Meeting Abstracts. :1232-1232
Contactless measurements are attractive because they do not contaminate the sample and generally do not require extensive sample preparation. It is for these reasons that they are more commonly used. We will discuss mainly methods for material but so
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8cd3474926de7dfe02d64d52fa4bb4c1
https://doi.org/10.1149/ma2006-02/25/1232
https://doi.org/10.1149/ma2006-02/25/1232
Characterization of Strained Si/SiGe With Pulsed MOS Capacitor and Gate Oxide Integrity Measurements
Autor:
Jiun-Hsin Liao, Dieter Schroder
Publikováno v:
ECS Meeting Abstracts. :1523-1523
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3992de3499498dffb1b3303b3c952dd6
https://doi.org/10.1149/ma2006-02/31/1523
https://doi.org/10.1149/ma2006-02/31/1523
Autor:
Joon-Young Choi, Dieter Schroder
Publikováno v:
ECS Meeting Abstracts. :567-567
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5467d1aad7fbeb6477af348b567647eb
https://doi.org/10.1149/ma2005-01/12/567
https://doi.org/10.1149/ma2005-01/12/567
Autor:
Dieter Schroder
Publikováno v:
Kyklos. 32:129-141
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::155aae67cd83d18e4fcf4778da03b626
https://doi.org/10.1111/j.1467-6435.1979.tb02597.x
https://doi.org/10.1111/j.1467-6435.1979.tb02597.x