Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Diego Alexandre Duarte"'
Autor:
Diego Alexandre Duarte, Marcos Massi
Publikováno v:
Materials Research, Vol 20, Iss 2, Pp 549-554 (2017)
N-doped TiO2 can be deposited by reactive magnetron sputtering by two methods: incorporation of nitrogen particles in the TiO2 lattice or incorporation of oxygen particles in the TiN lattice (oxidation). This paper investigates both procedures by exp
Externí odkaz:
https://doaj.org/article/be7bc5d3b74644289e3f52debaecf9fa
Autor:
José Renato Calvacanti de Queiroz, Diego Alexandre Duarte, Rodrigo Othávio de Assunção e Souza, Sara Fernanda Fissmer, Marcos Massi, Marco Antonio Bottino
Publikováno v:
Materials Research, Vol 14, Iss 2, Pp 212-216 (2011)
In this paper SiOx thin films were deposited on Y-TZP ceramics by reactive magnetron sputtering technique in order to improve the adhesion properties between Y-TZP and resin cement for applications in dental prosthesis. For fixed cathode voltage, tar
Externí odkaz:
https://doaj.org/article/56d6aea9dc2142f9a2406ccfaaafbb65
Autor:
Diego Alexandre Duarte
Publikováno v:
Biblioteca Digital de Teses e Dissertações do ITAInstituto Tecnológico de AeronáuticaITA.
Nesse trabalho são investigados os mecanismos de crescimento de filmes finos de N-TiO2 depositados por sputtering DC reativo e estudado os efeitos do processo de dopagem do TiO2 nos princípios de operação de células solares sensibilizadas por co
Autor:
Diego Alexandre Duarte
Publikováno v:
Biblioteca Digital de Teses e Dissertações do ITAInstituto Tecnológico de AeronáuticaITA.
Nesse trabalho é reportado o crescimento de filmes finos de dióxido de titânio (TiO2) por duas técnicas assistidas a plasma chamadas magnetron sputtering convencional (MSC) e magnetron sputtering catodo oco (MSCO). O dióxido de titânio foi cres
Autor:
Joel Stryhalski, Diego Alexandre Duarte, Luis Manuel Rebouta, Julio César Sagás, Carlos José Tavares, Luis Cesar Fontana
Publikováno v:
Materials Research
Abstract Niobium doped dititanium trioxide (Ti2O3:Nb) films were deposited on glass substrates, through grid-assisted magnetron sputtering. The Ti2O3:Nb films were characterized by X-ray diffraction (XRD), electrical conductivity and optical properti
Externí odkaz:
https://doaj.org/article/cc3a692779bc4b02ac3aee2fead234c6
Autor:
Viviane Lilian Soethe Parucker, Diego Alexandre Duarte, Moises Luiz Parucker, Andreia Larissa Alves de Almeida, Guilherme Eugenio Brustolin, Rafael Gallina Delatorre
Publikováno v:
Journal of Materials Research. 37:2862-2870