Zobrazeno 1 - 10
of 118
pro vyhledávání: '"Didier Theron"'
Autor:
Olivier Douheŕet, Jaume Llacer, Didier Theron, David Moerman, Philippe Leclère, Claudio Quarti, Xavier Noirfalise, Roberto Lazzaroni
Publikováno v:
ACS Applied Nano Materials
ACS Applied Nano Materials, American Chemical Society, 2020, 3 (8), pp.8268-8277. ⟨10.1021/acsanm.0c01687⟩
ACS Applied Nano Materials, 2020, 3 (8), pp.8268-8277. ⟨10.1021/acsanm.0c01687⟩
ACS Applied Nano Materials, American Chemical Society, 2020, 3 (8), pp.8268-8277. ⟨10.1021/acsanm.0c01687⟩
ACS Applied Nano Materials, 2020, 3 (8), pp.8268-8277. ⟨10.1021/acsanm.0c01687⟩
International audience; Understanding the surface properties of hybrid perovskite materials is a key aspect to improve not only the interface properties in photovoltaic cells but also the stability against moisture degradation. In this work, we study
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5fee06ad27cd04810b11c1b607d5d370
https://doi.org/10.1021/acsanm.0c01687
https://doi.org/10.1021/acsanm.0c01687
Publikováno v:
Applied Sciences
Applied Sciences, MDPI, 2020, 10 (22), 8234, 11 p. ⟨10.3390/app10228234⟩
Volume 10
Issue 22
Applied Sciences, 2020, 10 (22), 8234, 11 p. ⟨10.3390/app10228234⟩
Applied Sciences, Vol 10, Iss 8234, p 8234 (2020)
Applied Sciences, MDPI, 2020, 10 (22), 8234, 11 p. ⟨10.3390/app10228234⟩
Volume 10
Issue 22
Applied Sciences, 2020, 10 (22), 8234, 11 p. ⟨10.3390/app10228234⟩
Applied Sciences, Vol 10, Iss 8234, p 8234 (2020)
International audience; Standing at the meeting between solid state physics and optical spectroscopy, microwave characterization methods are efficient methods to probe electronic mechanisms and mesoscopic transport in semiconducting polymers. Scannin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::95084101fc45ae69a298f77ccacaf732
https://hal.archives-ouvertes.fr/hal-03022518/document
https://hal.archives-ouvertes.fr/hal-03022518/document
Publikováno v:
Journal of Applied Physics
Journal of Applied Physics, 2021, 129 (11), pp.114502. ⟨10.1063/5.0039624⟩
Journal of Applied Physics, American Institute of Physics, 2021, 129 (11), pp.114502. ⟨10.1063/5.0039624⟩
Journal of Applied Physics, 2021, 129 (11), pp.114502. ⟨10.1063/5.0039624⟩
Journal of Applied Physics, American Institute of Physics, 2021, 129 (11), pp.114502. ⟨10.1063/5.0039624⟩
International audience; We report on the generic classical electric circuit modeling that describes standard single-tone microwave optomechanics. Based on a parallel RLC circuit in which a mechanical oscillator acts as a movable capacitor, derivation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5103b94e1962d1c35e5b5fde6c1b810
http://arxiv.org/abs/2007.14438
http://arxiv.org/abs/2007.14438
Autor:
Christophe Boyaval, D. Deresmes, Gilles Dambrine, V. Avramovic, P. Polovodov, Kamel Haddadi, Didier Theron, S. Eliet
Publikováno v:
Proceedings of IEEE/MTT-S International Microwave Symposium, IMS 2020
IEEE MTT International Microwave Symposium, IMS 2020
IEEE MTT International Microwave Symposium, IMS 2020, Jun 2020, Los Angeles (On-line event), United States. pp.95-98, ⟨10.1109/IMS30576.2020.9224090⟩
IEEE MTT International Microwave Symposium, IMS 2020
IEEE MTT International Microwave Symposium, IMS 2020, Jun 2020, Los Angeles (On-line event), United States. pp.95-98, ⟨10.1109/IMS30576.2020.9224090⟩
International audience; A near-field scanning millimeter-wave microscope is developed with broadband capabilities up to 67 GHz. The instrumentation has been designed to operate inside a scanning electron microscope for environment control and water m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f7da0c45930a74df069354351bbc8e8e
https://hal.science/hal-03022574
https://hal.science/hal-03022574
Autor:
Lionel Buchaillot, Pascal Tilmant, Marc Faucher, Stefan Degroote, Marianne Germain, Christophe Morelle, Vanessa Avramovic, V. Zhang, Joff Derluyn, Virginie Brandli, Etienne Okada, François Vaurette, Bertrand Grimbert, Didier Theron, Isabelle Roch-Jeune
Publikováno v:
Microsystem Technologies
Microsystem Technologies, Springer Verlag, 2018, 24 (1), pp.371-377. ⟨10.1007/s00542-017-3293-0⟩
Microsystem Technologies, 2018, 24 (1), pp.371-377. ⟨10.1007/s00542-017-3293-0⟩
Microsystem Technologies, Springer Verlag, 2018, 24 (1), pp.371-377. ⟨10.1007/s00542-017-3293-0⟩
Microsystem Technologies, 2018, 24 (1), pp.371-377. ⟨10.1007/s00542-017-3293-0⟩
International audience; Starting from Gallium Nitride epitaxially grown on silicon, pre-stressed micro-resonators with integrated piezoelectric transducers have been designed, fabricated, and characterized. In clamped-clamped beams, it is well known
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1b304c00cd5fa7abfa332bf3d9bb6d22
https://doi.org/10.1007/s00542-017-3293-0
https://doi.org/10.1007/s00542-017-3293-0
Publikováno v:
2019 IEEE/MTT-S International Microwave Symposium-IMS 2019
2019 IEEE/MTT-S International Microwave Symposium-IMS 2019, Jun 2019, Boston, France. pp.1276-1278, ⟨10.1109/MWSYM.2019.8700783⟩
2019 IEEE MTT-S International Microwave Symposium (IMS)
2019 IEEE/MTT-S International Microwave Symposium-IMS 2019, Jun 2019, Boston, France. pp.1276-1278, ⟨10.1109/MWSYM.2019.8700783⟩
2019 IEEE MTT-S International Microwave Symposium (IMS)
International audience; A novel active microwave interferometric technique is implemented on a multiport vector network analyzer for renormalizing the reference impedance 50 Ohms into any desired complex impedance. The resulting measured reflection c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bb6f586e464fdcc4c48bdc9134a04a26
https://hal.archives-ouvertes.fr/hal-02328441/document
https://hal.archives-ouvertes.fr/hal-02328441/document
Publikováno v:
2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)
2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Jul 2018, Nagoya, France. ⟨10.1109/MARSS.2018.8481160⟩
2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Jul 2018, Nagoya, Japan. ⟨10.1109/MARSS.2018.8481160⟩
2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Jul 2018, Nagoya, France. ⟨10.1109/MARSS.2018.8481160⟩
2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Jul 2018, Nagoya, Japan. ⟨10.1109/MARSS.2018.8481160⟩
International audience; Near-field scanning microwave microscopy (NSMM) has to face several issues for the establishment of traceable and quantitative data. In particular, at the nanoscale, the wavelength of operation in the microwave regime appears
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::941f318a9ed6c781ecd98dd8b47e3287
https://hal.archives-ouvertes.fr/hal-01913677
https://hal.archives-ouvertes.fr/hal-01913677
Autor:
P. Polovodov, Christophe Boyaval, Nicolas Clement, Fei Wang, D. Deresmes, C. Brillard, Kamel Haddadi, S. Eliet, Olaf C. Haenssler, Didier Theron, Gilles Dambrine
Publikováno v:
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Aug 2018, Reykjavik, Iceland. pp.1-4, ⟨10.1109/NEMO.2018.8503487⟩
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Aug 2018, Reykjavik, Iceland. pp.1-4, ⟨10.1109/NEMO.2018.8503487⟩
International audience; Near-field scanning microwave microscopy (NSMM) is a scanning probe microscopy (SPM) technique that measures the local interaction of evanescent microwaves with a sample using a sharp tip probe. The traceability in NSMM is sti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06ad7fdc1eb369b33316110cc81b02f9
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, 2018, 36 (2), pp.022901. ⟨10.1116/1.5006161⟩
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, AVS through the American Institute of Physics, 2018, 36 (2), pp.022901. ⟨10.1116/1.5006161⟩
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, 2018, 36 (2), pp.022901. ⟨10.1116/1.5006161⟩
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, AVS through the American Institute of Physics, 2018, 36 (2), pp.022901. ⟨10.1116/1.5006161⟩
Extracting simultaneously multimodal nanoscale specimen information, by an integrated microscopy technology, is in the focus of this report. The combination of multiple imaging techniques allows for obtaining complementary and often unique datasets o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::49748a67214bd7371a841ee1502d1494
https://hal.science/hal-03022536/document
https://hal.science/hal-03022536/document
Autor:
Mina Rais-Zadeh, Yvon Cordier, Vikrant J. Gokhale, Didier Theron, Marc Faucher, Lionel Buchaillot, Azadeh Ansari
Publikováno v:
Journal of Microelectromechanical Systems. 23:1252-1271
Gallium nitride (GaN) is a wide bandgap semiconductor material and is the most popular material after silicon in the semiconductor industry. The prime movers behind this trend are LEDs, microwave, and more recently, power electronics. New areas of re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7396f80bb4940908e93ed67c77be8ecf
https://doi.org/10.1109/jmems.2014.2352617
https://doi.org/10.1109/jmems.2014.2352617