Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Devon S. Jakob"'
Publikováno v:
Nature Communications, Vol 9, Iss 1, Pp 1-11 (2018)
Scanning near-field optical microscopy (SNOM) offers nanometer-scale spatial resolution, but generally does not retain tomographic information. Here, Wang et al. develop peak-force SNOM to section scattered fields and improve imaging resolution.
Externí odkaz:
https://doaj.org/article/45d9c5f83773420497d9b8c58dc37a64
Publikováno v:
AIP Advances, Vol 7, Iss 5, Pp 055118-055118-7 (2017)
Scattering-type scanning near-field optical microscopy (s-SNOM) enables mapping of nanoscale field distributions in two dimensions. However, the standard s-SNOM technique lacks direct resolving ability along the vertical direction, therefore unable t
Externí odkaz:
https://doaj.org/article/9a2038e7733d4b8586863218cb86a53f
Autor:
Xiaohui Qiu, Xiaoxian Zhang, Hong Zhang, Yuan Zhang, Lina Li, Xiaoji G. Xu, Huiqiong Zhou, Boxin Wang, Xinfeng Liu, Devon S. Jakob, Yong Zhang, Xing Li, Yanxun Li, Xuning Zhang, Yingguo Yang, Cheng Liang, Jianqi Zhang, Wenna Du, Guangjie Zhang, Jianwei Ding
Publikováno v:
Joule. 5:3154-3168
Summary Surface energy of the underneath interlayer plays a crucial role in determining the morphology of bulk-heterojunction (BHJ) film in solution-processed organic solar cells (OSCs). However, little attention has been paid to this perspective at
Liquid medium annealing for fabricating durable perovskite solar cells with improved reproducibility
Autor:
Xueyun Wang, Xixia Liu, Cheng Zhu, Sai Ma, Huachao Zai, Yihua Chen, Haipeng Xie, Rundong Fan, Huifen Liu, Yu Zhang, Qi Chen, Xiaoji G. Xu, Zhenyu Guo, Xiao Zhang, Jianpu Wang, Liang Li, Xiuxiu Niu, Zijian Huang, Yang Bai, Hong Chen, Devon S. Jakob, Yingzhuo Lun, Nengxu Li, Huanping Zhou, Hao Wang, Jiawang Hong, Guilin Liu
Publikováno v:
Science. 373:561-567
Solution processing of semiconductors is highly promising for the high-throughput production of cost-effective electronics and optoelectronics. Although hybrid perovskites have potential in various device applications, challenges remain in the develo
Autor:
Etienne Cabane, Johannes Konnerth, Xiaoji G. Xu, Dmitri V. Vezenov, Claudia Gusenbauer, Devon S. Jakob
Publikováno v:
Biomacromolecules
Biomacromolecules, 21 (10)
Biomacromolecules, 21 (10)
Peak force infrared (PFIR) microscopy is a recently developed approach to acquire multiple chemical and physical material properties simultaneously and with nanometer resolution: topographical features, infrared (IR)-sensitive maps, adhesion, stiffne
Publikováno v:
Small (Weinheim an der Bergstrasse, Germany). 17(37)
Kelvin probe force microscopy (KPFM) is a popular technique for mapping the surface potential at the nanoscale through measurement of the Coulombic force between an atomic force microscopy (AFM) tip and sample. The lateral resolution of conventional
Autor:
Xiaoji G. Xu, Devon S. Jakob
Publikováno v:
Advanced Chemical Microscopy for Life Science and Translational Medicine 2021.
Multimodal measurements of chemical composition, electrical properties, mechanical properties, and topography by scanning probe microscopy (SPM) deliver correlations across properties at the nanoscale, and provide clues to the structure-function rela
Autor:
Shirin Asaadi, Tiina Nypelö, Dmitri V. Vezenov, Xiaoji G. Xu, Herbert Sixta, Claudia Gusenbauer, Devon S. Jakob, Johannes Konnerth
Publikováno v:
International journal of biological macromolecules. 165
Tuning the composition of regenerated lignocellulosic fibers in the production process enables targeting of specific material properties. In composite materials, such properties could be manipulated by controlled heterogeneous distribution of chemica
Publikováno v:
ACS nano. 14(4)
Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures and surface residual charges. Kelvin probe force microscopy (KPFM), an imaging technique of atomic force micr
Publikováno v:
Jakob, D S, Wang, H, Zeng, G, Otzen, D E, Yan, Y & Xu, X 2020, ' Peak Force Infrared-Kelvin Probe Force Microscopy ', Angewandte Chemie International Edition, vol. 59, no. 37, pp. 16083-16090 . https://doi.org/10.1002/anie.202004211
Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provides insight into structure-functional relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution