Zobrazeno 1 - 10
of 34
pro vyhledávání: '"Devoivre, T."'
Autor:
Fadlallah, M., Szewczyk, A., Giannakopoulos, C., Cretu, B., Monsieur, F., Devoivre, T., Jomaah, J., Ghibaudo, G.
Publikováno v:
In Microelectronics Reliability 2001 41(9):1361-1366
Autor:
Morin, P., Cacho, F., Beneyton, R., Dumont, B., Bidaud, M., Josse, E., Gallon, C., Ranica, R., Villaret, A., Bianchini, R., Devoivre, T., Serret, E., Binger, R., Barla, K., Haond, M., Colin, A., Bono, H., Chaton, C.
Publikováno v:
2009 Proceedings of the European Solid State Device Research Conference; 2009, p288-291, 4p
Publikováno v:
2007 IEEE Custom Integrated Circuits Conference; 2007, p615-618, 4p
Autor:
Difrenza, R., Rochereau, K., Devoivre, T., Tavel, B., Duriez, B., Roy, D., Jullian, S., Dezzani, A., Boulestin, R., Stolk, P., Arnaud, F.
Publikováno v:
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005 (ICMTS 2005); 2005, p137-142, 6p
Autor:
Devoivre, T., Lunenborg, M., Julien, C., Carrere, J.-P., Ferreira, P., Toren, W.J., VandeGoor, A., Gayet, P., Berger, T., Hinsinger, O., Vannier, P., Trouiller, Y., Rody, Y., Goirand, P.-J., Palla, R., Thomas, I., Guyader, F., Roy, D., Borot, B., Planes, N.
Publikováno v:
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design & Testing (MTDT2002); 2002, p157-162, 6p
Publikováno v:
ICMTS 1999 Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat No99CH36307); 1999, p111-116, 6p
Publikováno v:
29th European Solid-State Device Research Conference; 1999, Issue 1, p420-423, 4p
Publikováno v:
28th European Solid-State Device Research Conference; 1998, p152-155, 4p
Publikováno v:
IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference & Workshop (Cat No98CH36168); 1998, p434-438, 5p
Publikováno v:
In Microelectronics Reliability 1 April 2000 40(4-5):571-575