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pro vyhledávání: '"Devizenko, I.Yu."'
Autor:
Zubarev, E.N., Samofalov, V.N., Devizenko, A.Yu. ⁎, Devizenko, I.Yu., Kondratenko, V.V., Sevryukov, D.V., Sevryukova, V.A., Mamon, V.V.
Publikováno v:
In Journal of Magnetism and Magnetic Materials 1 December 2021 539
Publikováno v:
Functional materials. 25:505-515
X-ray reflectometry in the hard X-ray region (λ = 0.154 nm) was used to investigate the barrier properties of carbon layers 0.2-1.3 nm thick in Sc/Si multilayer X-ray mirrors (MXMs) deposited by DC magnetron sputtering. Precise measurement of the MX
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d5a6fd6731f9fd41b101c654ef8ea09d
https://doi.org/10.15407/fm25.03.505
https://doi.org/10.15407/fm25.03.505