Direct Extraction of an Empirical Temperature-Dependent InGaP/GaAs HBT Large-Signal Model.

Autor: Raghavan, Arvind, Venkataraman, Sunitha, Banerjee, Bhaskar, Youngsuk Suh, Deukhyoum Heo, Laskar, Joy

Publikováno v: IEEE Journal of Solid-State Circuits; Sep2003, Vol. 38 Issue 9, p1443-1450, 8p, 2 Diagrams, 3 Charts, 10 Graphs