Zobrazeno 1 - 10
of 476
pro vyhledávání: '"Detlefs C"'
Autor:
Isern, H., Brochard, T., Dufrane, T., Brumund, P., Papillon, E., Scortani, D., Hino, R., Yildirim, C., Lamas, R. Rodriguez, Li, Y., Sarkis, M., Detlefs, C.
Dark Field X-ray Microscopy (DFXM) is a full-field imaging technique for non-destructive 3D mapping of orientation and strain in crystalline elements. The new DFXM beamline at ID03, developed as part of the ESRF Phase II Upgrade Project (EBSL2), was
Externí odkaz:
http://arxiv.org/abs/2410.13391
Autor:
Jørgensen, P. S., Besley, L., Slyamov, A. M., Diaz, A., Guizar-Sicairos, M., Odstrcil, M., Holler, M., Silvestre, C., Chang, B., Detlefs, C., Andreasen, J. W.
We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The capabilities of
Externí odkaz:
http://arxiv.org/abs/2307.01735
Autor:
Chen, Y., Tang, Y. T., Collins, D. M., Clark, S. J., Ludwig, W., Rodriguez-Lamas, R., Detlefs, C., Reed, R. C., Lee, P. D., Withers, P. J., Yildirim, C.
The industrialization of Laser Additive Manufacturing (LAM) is challenged by the undesirable microstructures and high residual stresses originating from the fast and complex solidification process. Non-destructive assessment of the mechanical perform
Externí odkaz:
http://arxiv.org/abs/2303.04764
Autor:
Zelenika, A., Yildirim, C., Detlefs, C., Rodriguez-Lamas, R., Grumsen, F.B., Poulsen, H.F., Winther, G.
Publikováno v:
In Acta Materialia 15 May 2024 270
Publikováno v:
Journal of Applied Crystallography, 54, 6 (2021)
Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a
Externí odkaz:
http://arxiv.org/abs/2007.09475
Autor:
Yildirim, C., Vitoux, H., Dresselhaus-Cooper, L. E., Steinmann, R., Watier, Y., Cook, P. K., Kutsal, M., Detlefs, C.
We present a multi-purpose mirror furnace designed for synchrotron X-ray experiments. The furnace is optimized specifically for dark-field X-ray microscopy (DFXM) of crystalline materials at the beamline ID06 of the ESRF. The furnace can reach up to
Externí odkaz:
http://arxiv.org/abs/1912.01255
Autor:
Hlushko, K., Ziegelwanger, T., Reisinger, M., Todt, J., Meindlhumer, M., Beuer, S., Rommel, M., Greving, I., Flenner, S., Kopeček, J., Keckes, J., Detlefs, C., Yildirim, C.
Publikováno v:
In Acta Materialia 1 July 2023 253
Autor:
Yildirim, C., Mavrikakis, N., Cook, P.K., Rodriguez-Lamas, R., Kutsal, M., Poulsen, H.F., Detlefs, C.
Publikováno v:
In Scripta Materialia June 2022 214
Autor:
Fabrèges, X., Ressouche, E., Duc, F., de Brion, S., Amara, M., Detlefs, C., Paolasini, L., Suard, E., Regnault, L. -P., Canals, B., Strobel, P., Simonet, V.
Publikováno v:
Phys. Rev. B 95, 014428 (2017)
In the spinel compound GeCo$_2$O$_4$, the Co$^{2+}$ pyrochlore sublattice presents remarkable magnetic field-induced behaviors that we unveil through neutron and X-ray single-crystal diffraction. The N\'eel ordered magnetic phase is entered through a
Externí odkaz:
http://arxiv.org/abs/1609.08805
Following the recent developement of Fourier ptychographic microscopy (FPM) in the visible range by Zheng et al. (2013), we propose an adaptation for hard x-rays. FPM employs ptychographic reconstruction to merge a series of low-resolution, wide fiel
Externí odkaz:
http://arxiv.org/abs/1609.07513