Zobrazeno 1 - 10
of 125
pro vyhledávání: '"Deshayes, Y."'
Publikováno v:
In Microelectronics Reliability November 2023 150
Publikováno v:
In Microelectronics Reliability September 2017 76-77:579-583
Autor:
Del Vecchio, P., Curutchet, A., Deshayes, Y., Bettiati, M., Laruelle, F., Labat, N., Béchou, L.
Publikováno v:
In Microelectronics Reliability August-September 2015 55(9-10):1741-1745
Autor:
Albert, P., Deshayes, Y., Hamon*, G., JAOUAD, A., VOLATIER, M., Aimez, V., Bechou, L., Darnon, M.
Publikováno v:
17th Conference on Concentrated Photovoltaics Systems (CPV17)
17th Conference on Concentrated Photovoltaics Systems (CPV17), Apr 2021, Freiburg, Germany
17th Conference on Concentrated Photovoltaics Systems (CPV17), Apr 2021, Freiburg, Germany
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::eb662392b8c3f18090d14da2a2a655b9
https://hal.archives-ouvertes.fr/hal-03349727
https://hal.archives-ouvertes.fr/hal-03349727
Publikováno v:
In Optics and Laser Technology 2008 40(4):589-601
Autor:
Huyghe, S., Bechou, L., Zerounian, N., Deshayes, Y., Aniel, F., Denolle, A., Laffitte, D., Goudard, J.L., Danto, Y.
Publikováno v:
In Microelectronics Reliability 2005 45(9):1593-1599
Publikováno v:
In Measurement 2003 34(2):157-178
Autor:
Mendizabal, L., Verneuil, J.L., Bechou, L., Aupetit-Berthelemot, C., Deshayes, Y., Verdier, F., Dumas, J.M., Danto, Y., Laffitte, D., Goudard, J.L., Hernandez, Y.
Publikováno v:
In Microelectronics Reliability 2003 43(9):1743-1749
Publikováno v:
In Microelectronics Reliability 2003 43(7):1137-1144
Autor:
Deshayes, Y., Bechou, L., Deletage, J.Y., Verdier, F., Danto, Y., Laffitte, D., Goudard, J.L.
Publikováno v:
In Microelectronics Reliability 2003 43(7):1125-1136