Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Derrik Adams"'
Autor:
Michael P. Miles, David T. Fullwood, Eric R. Homer, Brown Tyson W, Derrik Adams, Raj K. Mishra
Publikováno v:
Journal of Microscopy. 282:60-72
Electron Backscatter Diffraction (EBSD) is a widely used approach for characterising the microstructure of various materials. However, it is difficult to accurately distinguish similar (body centred cubic and body centred tetragonal, with small tetra
Autor:
Eric R. Homer, Michael P. Miles, Jeff Cramer, Raj K. Mishra, Brown Tyson W, Derrik Adams, David T. Fullwood, Shamoon Irfan
Publikováno v:
Microscopy and Microanalysis. 26:641-652
Improved plasticity models require simultaneous experimental local strain and microstructural evolution data. Microscopy tools, such as electron backscatter diffraction (EBSD), that can monitor transformation at the relevant length-scale, are often i
Autor:
Raj K. Mishra, Anil K. Sachdev, David T. Fullwood, Michael P. Miles, Eric R. Homer, Jeff Cramer, Derrik Adams, Brown Tyson W
Publikováno v:
Materials Science and Engineering: A. 734:192-199
Forming limits and retained austenite (RA) transformation in Q&P 1180 steel are quantified as a function of plastic strain levels for three different strain paths. In-plane uniaxial tension testing was performed in a standard test frame, while limiti
Autor:
Alex Farnsworth, Kaylee Rellaford, Scott D. Smith, Derrik Adams, Shawn C. Averett, James E. Patterson, David T. Fullwood
Publikováno v:
Measurement Science and Technology. 32:075202
Second harmonic generation (SHG), a laser-based surface technique, was used to characterize near-surface defect evolution associated with mechanical deformation in 2024-T3 aluminum due to tensile loads. Electron backscatter diffraction (EBSD) measure
Autor:
Adams, Derrik1 (AUTHOR), Miles, Michael P.1 (AUTHOR), Homer, Eric R.1 (AUTHOR), Brown, Tyson2 (AUTHOR), Mishra, Raj K.2 (AUTHOR), Fullwood, David T.1 (AUTHOR) dfullwood@byu.edu
Publikováno v:
Journal of Microscopy. Apr2021, Vol. 282 Issue 1, p60-72. 13p.
Autor:
Hodgson, Karyn
Publikováno v:
SDM: Security Distributing & Marketing. May2011, Vol. 41 Issue 5, p87-92. 4p.