Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Derming Lian"'
Autor:
Derming Lian, Pei Li Lin
Publikováno v:
Microelectronics Reliability. 56:66-72
In this work, a Berkovich nanoindentation was employed to measure the elastic–plastic transition of the SiGe film. Pop-in events are observed from the penetration depths of 17.1 to 18.2 nm, 15.2 to 15.65 nm, and 15.5 to 17 nm; while the conditions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f3c443dd07a2490d679f020a1ee370f
https://doi.org/10.1016/j.microrel.2015.11.001
https://doi.org/10.1016/j.microrel.2015.11.001
Publikováno v:
Applied Surface Science. 330:185-190
We successfully discover the trend of elastic to plastic contact phenomena of 200-nm-thick Si 0.80 Ge 0.20 and Si 0.75 Ge 0.25 films using scanning probe microscope. It is evidenced that elastic to plastic contact is dominated using thermal treatment
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfc2ad55537a453dc9d741674c70727f
https://doi.org/10.1016/j.apsusc.2014.11.165
https://doi.org/10.1016/j.apsusc.2014.11.165
Autor:
Derming Lian
Publikováno v:
International Journal of Materials Research. 105:139-144
In this study, we employed the nanoindentation technique to evaluate the pop-in events of Si–Ge multilayers under extra-low forces. X-ray diffraction revealed a shift of the peaks of the Ge atoms from 68.70 to 68.50°, due to gradual mixing of prev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e988a359a8ded2eb0ff93f040239c8e
https://doi.org/10.3139/146.111001
https://doi.org/10.3139/146.111001
Autor:
Derming Lian
Publikováno v:
International Journal of Materials Research. 105:44-49
In this study we used RF plasma-assisted molecular beam epitaxy for the epitaxial growth of single-crystalline indium nitride (InN) thin films on aluminum nitride buffer layers/Si (111) substrates. We then used scratch techniques to study the influen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0763adfddd4440a5828b4a9aa0d078a1
https://doi.org/10.3139/146.110997
https://doi.org/10.3139/146.110997
Autor:
Derming Lian
Publikováno v:
Journal of Physics and Chemistry of Solids. 74:1703-1707
The growth of metastable silicon germanium (Si 0.8 Ge 0.2 ) thin film on Si(1 0 0) by ultrahigh-vacuum chemical vapor deposition has been subjected to residual indentation studies. A nanoindentation system has been applied to analyze SiGe film after
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0231d7943c1d723a51165456cef2216c
https://doi.org/10.1016/j.jpcs.2013.06.012
https://doi.org/10.1016/j.jpcs.2013.06.012
Autor:
Derming Lian
Publikováno v:
Tribology Letters. 52:461-467
In this report, we provide a comparison of the thermal transition and wear mechanisms of the interfaces of multilayered silicon–germanium (SiGe) on Si sublayers. From wear experiments, we determined the inherent deformation modes of samples, in par
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e414ba309e2dc7c7a3e0d2e3046d0fa
https://doi.org/10.1007/s11249-013-0229-4
https://doi.org/10.1007/s11249-013-0229-4
Autor:
Hua-Chiang Wen, Derming Lian
Publikováno v:
International Journal of Materials Research. 104:542-546
In this study, we used scanning probe microscopy to observe the abrasion damage of annealed Si–Ge superlattices. Specimens were more amenable to plastic deformation after annealing, thereby providing higher friction coefficients as a result of decr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d426bb0c00ca4dcdd3e51b3d1848abc
https://doi.org/10.3139/146.110894
https://doi.org/10.3139/146.110894
Autor:
Derming Lian
Publikováno v:
Journal of Physics and Chemistry of Solids. 74:799-803
In this study, we employed scanning probe microscopy (SPM) and transmission electron microscopy (TEM) to investigate the interfacial adhesion strength of thermally treated SiGe superlattice thin films. From the SPM measurements, we deduced that th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2741ae76db14be86e097f67f908e1373
https://doi.org/10.1016/j.jpcs.2012.12.023
https://doi.org/10.1016/j.jpcs.2012.12.023
Autor:
Derming Lian
Publikováno v:
Applied Surface Science. 264:100-104
The aim of this study was to determine the microstructure and surface mechanical properties of tempered D6ac. The obtained microstructures exhibited a number of misfit dislocations from work hardening, with the degree of disorder dislocation decreasi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f5ba35fb81ed39c5a0f3cb04f36f3844
https://doi.org/10.1016/j.apsusc.2012.09.129
https://doi.org/10.1016/j.apsusc.2012.09.129
Autor:
Tien-Yu Lin, Derming Lian, Zue-Chin Chang, Wen-Kuang Hsu, Chien-Huang Tsai, Chang-Pin Chou, Hua-Chiang Wen
Publikováno v:
Journal of Physics and Chemistry of Solids. 72:789-793
The present study evaluates the wear performance of silicon–germanium (SiGe) epitaxial growth of thin films, in which the in situ scratch profile is followed by ex situ atomic force microscopy (AFM) examinations. The wear evaluation of SiGe films w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::66252b8969549e9236fcfe67205abb81
https://doi.org/10.1016/j.jpcs.2011.03.015
https://doi.org/10.1016/j.jpcs.2011.03.015