Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Deok-Soo Park"'
Small-signal modeling approach to 0.1-μm metamorphic HEMTs for W-band coplanar MMIC amplifier design
Publikováno v:
Current Applied Physics. 12:81-88
We present an accurate and reliable modeling method for designing the W-band (75–110 GHz) small-signal millimeter-wave monolithic integrated circuit (MMIC) amplifiers with the GaAs-based 0.1-μm metamorphic high electron-mobility transistors (MHEMT
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01f5ca223b7cadb89d11d0faa4803ab1
https://doi.org/10.1016/j.cap.2011.04.046
https://doi.org/10.1016/j.cap.2011.04.046
Autor:
Sang-Hun Lee, Gary P. Kennedy, Sun-Jin Kim, Nam-Young Kim, Jeiyoung Lee, Deok-Soo Park, Sang-Hoon Cheon, Bhanu Shrestha, Young-Ho Lee
Publikováno v:
2005 Asia-Pacific Microwave Conference Proceedings.
In this paper, an InGaP/GaAs HBT MMIC broadband mixer with high output power is designed within a total chip area of 2.3 /spl times/ 0.85 mm/sup 2/. The down-conversion mixer shows return loss of 20 dB and a conversion gain of -2.7 dB in the broadban
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03fabb64276c9de971fcff94192a6730
https://doi.org/10.1109/apmc.2005.1606497
https://doi.org/10.1109/apmc.2005.1606497
Publikováno v:
Advances in Biometrics ISBN: 9783540311119
ICB
ICB
The performance of a fingerprint recognition system relies on the quality of the input fingerprint images. Several researches have been studied on the enhancement of fingerprint images for fingerprint recognition. The representative enhancement is th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::60e1c5990cb0446afa0021bf440606e7
https://doi.org/10.1007/11608288_35
https://doi.org/10.1007/11608288_35
Publikováno v:
IEEE MTT-S International Microwave Symposium Digest, 2005..
A new large signal HBT model is proposed and experimentally evaluated, which contains measurement based diffusion charge and analytical depletion capacitance formulations. In order to account for the complicated dependency of diffusion charge on bias
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dfe3b6ff89e1665385ca82578ba53e91
https://doi.org/10.1109/mwsym.2005.1516883
https://doi.org/10.1109/mwsym.2005.1516883
Autor:
Young-Ho Lee, Sang-Hun Lee, Jeiyoung Lee, Deok-Soo Park, Sang-Hoon Cheon, Bhanu Shrestha, Sun-Jin Kim, Kennedy, G.P., Nam-Young Kim
Publikováno v:
2005 Asia-Pacific Microwave Conference Proceedings; 2005, p4-4, 1p