Zobrazeno 1 - 10
of 115
pro vyhledávání: '"Denorme, S."'
Autor:
Azzaz, M., Benoist, A., Vianello, E., Garbin, D., Jalaguier, E., Cagli, C., Charpin, C., Bernasconi, S., Jeannot, S., Dewolf, T., Audoit, G., Guedj, C., Denorme, S., Candelier, P., Fenouillet-Beranger, C., Perniola, L.
Publikováno v:
In Solid State Electronics November 2016 125:182-188
Autor:
Monfray, S., Fenouillet-Beranger, C., Bidal, G., Boeuf, F., Denorme, S., Huguenin, J.L., Samson, M.P., Loubet, N., Hartmann, J.M., Campidelli, Y., Destefanis, V., Arvet, C., Benotmane, K., Clement, L., Faynot, O., Skotnicki, T.
Publikováno v:
In Solid State Electronics February 2010 54(2):90-96
Autor:
Huguenin, J.L., Bidal, G., Denorme, S., Fleury, D., Loubet, N., Pouydebasque, A., Perreau, P., Leverd, F., Barnola, S., Beneyton, R., Orlando, B., Gouraud, P., Salvetat, T., Clement, L., Monfray, S., Ghibaudo, G., Boeuf, F., Skotnicki, T.
Publikováno v:
In Solid State Electronics 2010 54(9):883-889
Autor:
Fenouillet-Beranger, C., Perreau, P., Denorme, S., Tosti, L., Andrieu, F., Weber, O., Monfray, S., Barnola, S., Arvet, C., Campidelli, Y., Haendler, S., Beneyton, R., Perrot, C., de Buttet, C., Gros, P., Pham-Nguyen, L., Leverd, F., Gouraud, P., Abbate, F., Baron, F., Torres, A., Laviron, C., Pinzelli, L., Vetier, J., Borowiak, C., Margain, A., Delprat, D., Boedt, F., Bourdelle, K., Nguyen, B.-Y., Faynot, O., Skotnicki, T.
Publikováno v:
In Solid State Electronics 2010 54(9):849-854
Autor:
Bidal, G., Loubet, N., Fenouillet-Beranger, C., Denorme, S., Perreau, P., Fleury, D., Clement, L., Laviron, C., Leverd, F., Gouraud, P., Barnola, S., Beneyton, R., Torres, A., Duluard, C., Chapon, J.D., Orlando, B., Salvetat, T., Grosjean, M., Deloffre, E., Pantel, R., Dutartre, D., Monfray, S., Ghibaudo, G., Boeuf, F., Skotnicki, T.
Publikováno v:
In Solid State Electronics 2009 53(7):735-740
Autor:
Fenouillet-Beranger, C., Denorme, S., Perreau, P., Buj, C., Faynot, O., Andrieu, F., Tosti, L., Barnola, S., Salvetat, T., Garros, X., Cassé, M., Allain, F., Loubet, N., Pham-Nguyen, L., Deloffre, E., Gros-Jean, M., Beneyton, R., Laviron, C., Marin, M., Leyris, C., Haendler, S., Leverd, F., Gouraud, P., Scheiblin, P., Clement, L., Pantel, R., Deleonibus, S., Skotnicki, T.
Publikováno v:
In Solid State Electronics 2009 53(7):730-734
Autor:
Cabout, T., Vianello, E., Jalaguier, E., Grampeix, H., Molas, G., Blaise, P., Cueto, O., Guillermet, M., Nodin, J., Perniola, L., Blonkowski, S., Jeannot, S., Denorme, S., Candelier, P., Bocquet, Marc, Muller, Christophe
Publikováno v:
2014 IEEE 6th International Memory Workshop (IMW)
2014 IEEE 6th International Memory Workshop (IMW), May 2014, Taipei, France. ⟨10.1109/IMW.2014.6849355⟩
2014 IEEE 6th International Memory Workshop (IMW), May 2014, Taipei, France. ⟨10.1109/IMW.2014.6849355⟩
International audience; In this paper the effect of SET temperature on data-retention performances in HfO2-based RRAM has been thoroughly investigated. We demonstrated, for the first time to our knowledge, that high temperature programming (even if i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3abaf8618a6bf6e5c41cd6ea6478b1f0
https://hal.science/hal-01738447
https://hal.science/hal-01738447
Autor:
Bidal, G., Huguenin, J.L., Denorme, S., Fleury, D., Loubet, N., Pouydebasque, A., Perreau, P., Leverd, F., Barnola, S., Beneyton, R., Orlando, B., Gouraud, P., Salvetat, T., Clement, L., Monfray, S., Boeuf, F., Skotnicki, T.
Publikováno v:
39th European Solid-State Device Research Conference
39th European Solid-State Device Research Conference, Sep 2009, Athènes, Greece
39th European Solid-State Device Research Conference, Sep 2009, Athènes, Greece
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::aae93b52b99e35f1f1941e163a392b2e
https://hal.science/hal-00603722
https://hal.science/hal-00603722
Autor:
Bidal, G., Boeuf, F., Denorme, S., Loubet, N., Leverd, F., Lagrasta, S., Orlando, B., Beneyton, R., Clement, L., Pantel, R., Monfray, S., Skotnicki, T.
Publikováno v:
IEEE Symposium on VLSI Technology (VLSI Symposium)
Proceedings to be published
Proceedings to be published, Jun 2009, Kyoto, Japan
Proceedings to be published
Proceedings to be published, Jun 2009, Kyoto, Japan
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::5c4f3135f3f43c1264528724858fae0b
https://hal.archives-ouvertes.fr/hal-00604254
https://hal.archives-ouvertes.fr/hal-00604254
Publikováno v:
IEEE International Electron Devices
IEEE International Electron Devices, Dec 2009, Balitimore, United States
IEEE International Electron Devices, Dec 2009, Balitimore, United States
National audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::19d582f1afe7916c44647885b10b75e6
https://hal.science/hal-00603803
https://hal.science/hal-00603803