Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Denny, Y. R."'
Publikováno v:
AIP Conference Proceedings; 2024, Vol. 3163 Issue 1, p1-6, 6p
Publikováno v:
IOP Conference Series: Earth & Environmental Science; 2022, Vol. 978, p1-8, 8p
Autor:
Denny, Y. R., Shin, H. C., Seo, S., Oh, S. K., Kang, H. J., Tahir, Dahlang, Heo, S., Chung, J. G., Lee, J. C., Tougaard, Sven
The electronic and optical properties of GaInZnO (GIZO), HfInZnO (HIZO) and InZnO (IZO) thin films on glass substrates were investigated using X-ray photoelectron spectroscopy (XPS) and reflection electron energy loss spectroscopy (REELS). XPS result
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2356::b8620de2805f470620df5f9ed7686e23
http://repository.unhas.ac.id/handle/123456789/8427
http://repository.unhas.ac.id/handle/123456789/8427
Autor:
Shin, H. C., Tahir, Dahlang, Seo, S., Denny, Y. R., Oh, S. K., Kang, H. J., Heo, S., Chung, J. G.
The band alignment of HfZrO4 gate oxide thin films on Si (100) deposited by the atomic layer deposition method has been investigated using reflection electron energy loss spectroscopy and XPS. The band gap of HfZrO4 gate oxide thin film is 5.40 0.05
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2356::124133a1fffb88eba173a1144c29dc5c
http://repository.unhas.ac.id/handle/123456789/8438
http://repository.unhas.ac.id/handle/123456789/8438