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pro vyhledávání: '"Dennis C.P. Leung"'
Publikováno v:
2019 Electrical Design of Advanced Packaging and Systems (EDAPS).
As the silicon technology shrinking transistors to deep nanometer, the IO speed and logic density drive up the package design complexity drastically. The design performance validation is no longer scalable by resorting to traditional electrical model
Autor:
Guna S Selvaduray, Dennis C.P. Leung
Publikováno v:
Journal of Microelectronics and Electronic Packaging. 5:104-115
Microvia failures in flip chip ball grid array (FCBGA) polymeric substrates have been a major concern in the development of reliable packages for high-performance and high-density chips. To determine the relationship between reliability and design fa