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pro vyhledávání: '"Dennis A. Kriczky"'
Autor:
Jeff Irwin, Abdalla R. Nassar, Pan Michaleris, James Craig, Dennis A. Kriczky, Edward W. Reutzel
Publikováno v:
Journal of Materials Processing Technology. 221:172-186
A method to analyze and visualize thermal metrics extracted from coaxial thermal images collected during a 3D directed energy deposition is developed as a non-destructive means to assess thermally driven material characteristics and part quality. Sta