Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Denis S. Silkin"'
Publikováno v:
Micromachines, Vol 13, Iss 8, p 1293 (2022)
A complete comparison for 14 nm FinFET and NWFET with stacked nanowires was carried out. The electrical and thermal performances in two device structures were analyzed based on TCAD simulation results. The electro-thermal TCAD models were calibrated
Externí odkaz:
https://doaj.org/article/70618e8a9f214234852e44eebba1da50
Publikováno v:
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT).