Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Denis M. Desloge"'
Publikováno v:
Microscopy and Microanalysis. 3:14-27
All lenses, whether for light or for electrons, have aberrations that limit their performance. In light optics the invention of the achromat over 200 years ago solved the problem of correcting spherical and chromatic aberrations; however, correcting
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 347:441-445
A new design of electrostatic optics has been evaluated to improve the performance of the X-ray photoemission microscope (XPEEM) used for micro X-ray-absorption fine-structure imaging. The new optics includes an objective lens with a steep conical sh
Publikováno v:
Journal of Microscopy. 168:249-258
SUMMARY Low-energy electron microscopy (LEEM) and mirror electron microscopy (MEM) utilize a parallel beam of slow-moving electrons backscattered from the specimen surface to form an image. If the electrons strike the surface an LEEM image is produce
Autor:
Denis M. Desloge, Gelsomina De Stasio, Walter P. Skoczylas, Delio Mercanti, Giorgio Margaritondo, Gertrude F. Rempfer, M. Teresa Ciotti
Publikováno v:
Physica Scripta. 51:411-412
The feasibility of using the LEEM technique in neurobiology was tested with experiments on a rat cerebellar granule cell culture. A series of good-quality images, showing fine details such as axons and dendrites of the neuron network, demonstrate tha