Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Denis Amparo"'
Publikováno v:
IEEE Transactions on Applied Superconductivity. 29:1-9
As superconducting circuits grow in complexity, full transient simulation and verification at the Josephson junction level using analog circuit simulators become increasingly computationally expensive. To enable faster functional and timing verificat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b779247b30acb462caf13414bab4d5aa
https://doi.org/10.1109/tasc.2019.2897317
https://doi.org/10.1109/tasc.2019.2897317
Publikováno v:
IEEE Transactions on Applied Superconductivity. 29:1-7
A test structure suite to measure circuit delays, power, and operating margins of single flux quantum (SFQ) circuits and to derive key parameters directly from dc testable high-speed circuits is described. This suite comprises a set of ring oscillato
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a3a5906b335286b3bfd6b265968bb28
https://doi.org/10.1109/tasc.2019.2898410
https://doi.org/10.1109/tasc.2019.2898410
Autor:
Oleg A. Mukhanov, Igor V. Vernik, Anubhav Sahu, M. Y. Kamkar, C. Shawawreh, Alex F. Kirichenko, Denis Amparo, A. Inamdar, M. Miller, Jie Ren
Publikováno v:
IEEE Transactions on Applied Superconductivity. 27:1-6
Energy efficiency has become the primary parameter for the design of next-generation single flux quantum (SFQ) circuits. This, however, needs to be balanced with optimization for clock speed and bias margins. Here, we experimentally study the tradeof
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::81f1f3bbe531a2d1c233b2d9c1bf1ade
https://doi.org/10.1109/tasc.2017.2669581
https://doi.org/10.1109/tasc.2017.2669581
Autor:
Rick T. Hunt, Alex F. Kirichenko, Igor V. Vernik, Alexander Cohen, Daniel Yohannes, John Vivalda, Denis Amparo
Publikováno v:
IEEE Transactions on Applied Superconductivity. 25:1-5
We report on technique and results for superconductor electronics fabrication process, featuring customizable number of planarized superconducting layers. The novel technique enhanced yield on stackable vias of our standard planarized process (RIPPLE
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ae6cc8859e60f7a2ad4f8901f4923c5e
https://doi.org/10.1109/tasc.2014.2365562
https://doi.org/10.1109/tasc.2014.2365562
Publikováno v:
IEEE Transactions on Applied Superconductivity. 25:1-8
Superconductor (SC) integrated circuits have several inherent advantages including low power, high speed, and fractional flux quantum sensitivity that can be exploited to achieve discriminating performance for several niche applications in the high-s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17039920d06e200098421316a55f23c2
https://doi.org/10.1109/tasc.2014.2365136
https://doi.org/10.1109/tasc.2014.2365136
Autor:
T.V. Filippov, M. Y. Kamkar, Jason Walter, Igor V. Vernik, O.A. Mukhanov, Denis Amparo, Alex F. Kirichenko
Publikováno v:
2017 16th International Superconductive Electronics Conference (ISEC).
We present test results for parallel data communication ERSFQ circuits with clock recovery. We experimentally study on-chip and chip-to-chip parallel data communication circuits with 4-, 8- and 16-bit word lengths. The largest circuit is a 16-bit chi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f7e64e0e10c81d305eb10ce65fcd872
https://doi.org/10.1109/isec.2017.8314191
https://doi.org/10.1109/isec.2017.8314191
Publikováno v:
IEEE Transactions on Applied Superconductivity. 21:119-125
New technology for superconductor integrated circuits has been developed and is presented. It employs diffusion stoplayers (DSLs) to protect Josephson junctions (JJs) from interlayer migration of impurities, improve JJ critical current (Ic) targeting
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::10f70cfbee86b56cb713eb8f13647df8
https://doi.org/10.1109/tasc.2010.2089665
https://doi.org/10.1109/tasc.2010.2089665
Autor:
Sergey K. Tolpygo, Denis Amparo
Publikováno v:
IEEE Transactions on Applied Superconductivity. 21:126-130
The correct operation and high performance of complex superconducting integrated circuits significantly depend on fabrication-process-induced variations of the Josephson junction critical current Ic. Such variations in Nb/Al/AlOx/Nb junctions were in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7e1c57b010e75e860d021f4fe8db6c66
https://doi.org/10.1109/tasc.2010.2086990
https://doi.org/10.1109/tasc.2010.2086990
Publikováno v:
IEEE Transactions on Applied Superconductivity. 19:135-139
It is shown that the critical current density, jc of Nb/AlOx/Nb Josephson junctions in multilayered structures such as superconductor integrated circuits depends on the junction environment and on which wiring layers make contacts to the junction ele
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05d1269dca1c771a52967925fd1df100
https://doi.org/10.1109/tasc.2009.2018253
https://doi.org/10.1109/tasc.2009.2018253
Autor:
Denis Amparo, Sergey K. Tolpygo
Publikováno v:
IEEE Transactions on Applied Superconductivity. 19:154-158
Fabrication-induced variations in the critical currents of Josephson junctions significantly affect the performance and yield of complex superconducting integrated circuits. Electrical stress that may develop during plasma processing steps in the fab
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f828bb3c167b413175292c8e4801318
https://doi.org/10.1109/tasc.2009.2019022
https://doi.org/10.1109/tasc.2009.2019022