Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Denis, Montaner"'
Publikováno v:
EURASIP Journal on Advances in Signal Processing, Vol 2005, Iss 17, Pp 2804-2815 (2005)
In white-light interference microscopy, measurement of surface shape generally requires peak extraction of the fringe function envelope. In this paper the Teager-Kaiser energy and higher-order energy operators are proposed for efficient extraction of
Externí odkaz:
https://doaj.org/article/18437a708be44045bb97fa0c55f0efec
Publikováno v:
Optics express. 25(17)
Full-field optical coherence tomography (FF-OCT) is a widely used technique for applications such as biological imaging, optical metrology, and materials characterization, providing structural and spectral information. By spectral analysis of the bac
Publikováno v:
Optical Micro-and Nanometrology VI
SPIE Photonics Europe 2016
SPIE Photonics Europe 2016, Apr 2016, Bruxelles, Belgium. ⟨10.1117/12.2227625⟩
SPIE Photonics Europe 2016
SPIE Photonics Europe 2016, Apr 2016, Bruxelles, Belgium. ⟨10.1117/12.2227625⟩
International audience; Interference microscopy is a widely used technique in optical metrology for the characterization of materials and in particular for measuring the micro and nanotopography of surfaces. Depending on the processing applied to the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f801fe160ac107ba750435fa8e8b0e59
https://hal.archives-ouvertes.fr/hal-02371577
https://hal.archives-ouvertes.fr/hal-02371577
Publikováno v:
Journal of Modern Optics. 48:533-547
In optoelectronic materials development, the analysis of buried interfaces is sometimes necessary in order to achieve the best optical and electrical performance. Interference microscopy has been investigated as a means to characterize interfaces bur
Autor:
Paul Montgomery, Denis Montaner
Publikováno v:
Microelectronic Engineering. 45:291-297
With the increase in diameter of Si wafers to 300 mm and above, and the decrease in minimum feature size to the deep submicron, there is a need to improve the lateral resolution of optical inspection techniques. Coherence microscopy normally uses a w
Publikováno v:
Proceedings of SPIE, Optical Measurement Systems for Industrial Inspection VIII, 05/2013.
Proceedings of SPIE, Optical Measurement Systems for Industrial Inspection VIII, 05/2013., May 2013, Munich, Germany. pp.87883G--87883G--11, ⟨10.1117/12.2020560⟩
Proceedings of SPIE, Optical Measurement Systems for Industrial Inspection VIII, 05/2013., May 2013, Munich, Germany. pp.87883G--87883G--11, ⟨10.1117/12.2020560⟩
Coherence scanning interferometry (CSI) is an optical profilometry technique that uses the scanning of white light interference fringes over the depth of the surface of a sample to measure the surface roughness. Many different types of algorithms hav
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b5d9bbd650999678591ee1b865f2d41e
https://hal.parisnanterre.fr/hal-01421680
https://hal.parisnanterre.fr/hal-01421680
Publikováno v:
European Material Research Society (E-MRS) Fall Meeting, Symposium on Highly Precise Characterization of Materials for Nano and Bio Technologies
European Material Research Society (E-MRS) Fall Meeting, Symposium on Highly Precise Characterization of Materials for Nano and Bio Technologies, Sep 2012, Warsaw, Poland
Applied Surface Science
Applied Surface Science, 2013, 281, pp. 89-95
Applied Surface Science, Elsevier, 2013, 281, pp. 89-95
European Material Research Society (E-MRS) Fall Meeting, Symposium on Highly Precise Characterization of Materials for Nano and Bio Technologies, Sep 2012, Warsaw, Poland
Applied Surface Science
Applied Surface Science, 2013, 281, pp. 89-95
Applied Surface Science, Elsevier, 2013, 281, pp. 89-95
In the development of nanomaterials and biomaterials, new characterization techniques are required that overcome the challenges presented by the increasing dimensional ratio between the different entities to be studied and the growing complexity intr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aa46e1d7a199f6ec643e19da12747573
https://hal.archives-ouvertes.fr/hal-00743275
https://hal.archives-ouvertes.fr/hal-00743275
Autor:
Denis Montaner, Mireille Del Nero, Paul Montgomery, Catherine Galindo, Rémi Barillon, Sylvia Georg, Eric Halter
Publikováno v:
Applied Surface Science
Applied Surface Science, Elsevier, 2010, 256, pp.6144-6252
Applied Surface Science, Elsevier, 2010, 256, pp.6144-6252
Colloidal layers play an important role in environmental studies, for example in the movement of radionuclides in nuclear waste management. New characterization techniques are required for studying such complex, porous layers. The purpose of this wor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::65b89b8dd740371201f9e9a3107180da
https://hal.archives-ouvertes.fr/hal-00505807
https://hal.archives-ouvertes.fr/hal-00505807
Micro-optical electro-mechanical systems (MOEMS) technology, making use of existing silicon based fabrication techniques shows great potential for making complete miniaturized hybrid devices. Such technology has been used to make a Fourier transform
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ccf7b45b100ecf2902994a28cfe3af2
http://doc.rero.ch/record/8415/files/Montgomery_P.C._-_The_metrology_of_a_miniature_FT_spectrometer_20071204.pdf
http://doc.rero.ch/record/8415/files/Montgomery_P.C._-_The_metrology_of_a_miniature_FT_spectrometer_20071204.pdf
Publikováno v:
Langmuir
Langmuir, American Chemical Society, 2007, 23, pp. 3912-3918
Langmuir, American Chemical Society, 2007, 23, pp. 3912-3918
Understanding the mechanisms of biomineralization continues to be an important area of research in physics, chemistry, materials science, medicine, and dentistry due to its importance in the formation of bones, teeth, cartilage, etc. Stimulated by th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::17c06dd41d64ee8735e07085d78c3956
https://hal.archives-ouvertes.fr/hal-00141677
https://hal.archives-ouvertes.fr/hal-00141677