Zobrazeno 1 - 10
of 106
pro vyhledávání: '"Dellasega, David"'
Autor:
Ghosh, Subrata, Righi, Massimiliano, Macrelli, Andrea, Divitini, Giorgio, Orecchia, Davide, Maffini, Alessandro, Goto, Francesco, Bussetti, Gianlorenzo, Dellasega, David, Russo, Valeria, Bassi, Andrea Li, Casari, Carlo S.
Publikováno v:
ChemSusChem 2024
In pulsed laser deposition, along the traditionally exploited deposition on the front-side of the plasma-plume, a coating forms on the surface of the target as well. For reproducibility, this residue is usually cleaned and discarded. Here we instead
Externí odkaz:
http://arxiv.org/abs/2405.08957
Autor:
Založnik, Anže, Dellasega, David, Alberti, Gabriele, Passoni, Matteo, Schwarz-Selinger, Thomas, Patino, Marlene I., Simmonds, Michael J., Baldwin, Matthew J., Tynan, George R.
Publikováno v:
In Nuclear Materials and Energy June 2024 39
Publikováno v:
Applied Surface Science, 2021, Volume 556,149678
Titanium (Ti), due to its excellent properties, is widely exploited in thin film technology that usually leads to the production of {\alpha}-phase (hcp) Ti films. In this work, we investigate the phase evolution of Ti films deposited by varying type
Externí odkaz:
http://arxiv.org/abs/2008.13709
Autor:
Pardanaud, Cédric, Dellasega, David, Passoni, Matteo, Martin, Céline, Roubin, Pascale, Addab, Younès, Arnas, Cécile, Couëdel, Lénaïc, Minissale, Marco, Salomon, Eric, Giacometti, Gregory, Merlen, Alexandre, Bernard, Elodie, Mateus, Rodrigo, Alves, Eduardo, Siketic, Zdravko, Radović, Iva Bogdanović, Hakola, Antti, Pfc, Eurofusion
Raman microscopy is one of the methods that could be used for future post-mortem analyses of samples extracted from ITER plasma facing. This study shows that this technique is useful for studying tungsten-based materials containing impurities includi
Externí odkaz:
http://arxiv.org/abs/2005.09295
Publikováno v:
Materials Characterization, 153, July 2019, Pages 92-102
In this paper we report the development of a new method for the evaluation of thin films mass thickness and composition based on the Energy Dispersive X-Ray Spectroscopy (EDS). The method exploits the theoretical calculation of the in-depth character
Externí odkaz:
http://arxiv.org/abs/1901.03616
Autor:
Uccello, Andrea, Ghezzi, Francesco, Kovač, Janez, Ekar, Jernej, Filipič, Tatjana, Bogdanović Radović, Iva, Dellasega, David, Mellera, Vittoria, Pedroni, Matteo, Ricci, Daria
Publikováno v:
In Nuclear Materials and Energy June 2023 35
In this work, we investigate the correlation between morphology, composition, and the mechanical properties of metallic amorphous tungsten-oxygen and amorphous tungsten-oxide films deposited by Pulsed Laser Deposition. This correlation is investigate
Externí odkaz:
http://arxiv.org/abs/1810.01201
Autor:
Dellasega, David, Russo, Valeria, Pezzoli, Andrea, Conti, Claudia, Lecis, Nora, Besozzi, Edoardo, Beghi, Marco, Bottani, Carlo E., Passoni, Matteo
Publikováno v:
Materials & Design, Volume 134, 15 November 2017, Pages 35-43
Micron-thick boron films have been deposited by Pulsed Laser Deposition in vacuum on several substrates at room temperature. The use of high energy pulses (>700 mJ) results in the deposition of smooth coatings with low oxygen uptake even at base pres
Externí odkaz:
http://arxiv.org/abs/1710.07202
Publikováno v:
In Applied Surface Science Advances February 2022 7
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