Výsledky vyhledávání - "DelRio, Frank"

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Refining microstructures in additively manufactured Al/Cu gradients through TiB$_2$ inclusions

Autor: Abere, Michael J., Choi, Hyein, Van Bastian, Levi, Jauregui, Luis, Babuska, Tomas F., Rodriguez, Mark. A, DelRio, Frank W., Whetten, Shaun R., Kustas, Andrew B.

The additive manufacture of compositionally graded Al/Cu parts by laser engineered net shaping (LENS) is demonstrated. The use of a blue light build laser enabled deposition on a Cu substrate. The thermal gradient and rapid solidification inherent to

Externí odkaz: http://arxiv.org/abs/2403.19861

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Unlocking High Performance, Ultra-Low Power Van der Waals Transistors: Towards Back-End-of-Line In-Sensor Machine Vision Applications

Autor: Alolaiyan, Olaiyan, Albwardi, Shahad, Alsaggaf, Sarah, Tabbakh, Thamer, DelRio, Frank W., Amer, Moh. R.

Recent reports on machine learning (ML) and machine vision (MV) devices have demonstrated the potentials of 2D materials and devices. Yet, scalable 2D devices are being challenged by contact resistance and Fermi Level Pinning (FLP), power consumption

Externí odkaz: http://arxiv.org/abs/2312.08634

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Exploring Layer Thinning of Exfoliated \b{eta}-Tellurene and Room Temperature Photoluminescence with Large Exciton Binding Energy Revealed in TeO2

Autor: Aljalham, Ghadeer, Alsaggaf, Sarah, Albawardi, Shahad, Tabbakh, Thamer, DelRio, Frank W., Amer, Moh. R.

Due to its tunable band gap, anisotropic behavior, and superior thermoelectric properties, device applications using layered tellurene (Te) are becoming attractive. Here, we report a thinning technique for exfoliated tellurene nanosheets using therma

Externí odkaz: http://arxiv.org/abs/2302.14394

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