Zobrazeno 1 - 10
of 296
pro vyhledávání: '"Del Alamo, JA"'
Autor:
Roh H; Massachusetts Institute of Technology, Department of Materials Science & Engineering, 77 Massachusetts Ave, Cambridge, MA, 02139, USA.; Massachusetts Institute of Technology, Department of Chemistry, 77 Massachusetts Ave, Cambridge, MA, 02139, USA., Kim DH; Massachusetts Institute of Technology, Department of Chemistry, 77 Massachusetts Ave, Cambridge, MA, 02139, USA., Cho Y; Massachusetts Institute of Technology, Department of Chemistry, 77 Massachusetts Ave, Cambridge, MA, 02139, USA.; Massachusetts Institute of Technology, Department of Chemical Engineering, 77 Massachusetts Ave, Cambridge, MA, 02139, USA., Jo YM; Massachusetts Institute of Technology, Department of Chemistry, 77 Massachusetts Ave, Cambridge, MA, 02139, USA., Del Alamo JA; Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 77 Massachusetts Ave, Cambridge, MA, 02139, USA.; MIT-IBM Watson AI Lab, 75 Binney St, Cambridge, MA, 02139, USA., Kulik HJ; Massachusetts Institute of Technology, Department of Chemistry, 77 Massachusetts Ave, Cambridge, MA, 02139, USA.; Massachusetts Institute of Technology, Department of Chemical Engineering, 77 Massachusetts Ave, Cambridge, MA, 02139, USA., Dincă M; Massachusetts Institute of Technology, Department of Chemistry, 77 Massachusetts Ave, Cambridge, MA, 02139, USA., Gumyusenge A; Massachusetts Institute of Technology, Department of Materials Science & Engineering, 77 Massachusetts Ave, Cambridge, MA, 02139, USA.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Jul; Vol. 36 (27), pp. e2312382. Date of Electronic Publication: 2024 Apr 28.
Autor:
Song, M-K, Kang, J-H, Zhang, X, Ji, W, Ascoli, A, Messaris, I, Demirkol, AS, Dong, B, Aggarwal, S, Wan, W, Hong, S-M, Cardwell, SG, Boybat, I, Seo, J-S, Lee, J-S, Lanza, M, Yeon, H, Onen, M, Li, J, Yildiz, B, Del Alamo, JA, Kim, S, Choi, S, Milano, G, Ricciardi, C, Alff, L, Chai, Y, Wang, Z, Bhaskaran, H, Hersam, MC, Strukov, D, Wong, H-SP, Valov, I, Gao, B, Wu, H, Tetzlaff, R, Sebastian, A, Lu, W, Chua, L, Yang, JJ, Kim, J
Memristive technology has been rapidly emerging as a potential alternative to traditional CMOS technology, which is facing fundamental limitations in its development. Since oxide-based resistive switches were demonstrated as memristors in 2008, memri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1064::627c2ba0e5f65ec5673a7b8202d1793d
https://doi.org/10.1021/acsnano.3c03505
https://doi.org/10.1021/acsnano.3c03505
Autor:
Onen M; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA.; MIT-IBM Watson AI Lab, 75 Binney St., Cambridge, MA 02142, USA., Emond N; MIT-IBM Watson AI Lab, 75 Binney St., Cambridge, MA 02142, USA.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA., Wang B; MIT-IBM Watson AI Lab, 75 Binney St., Cambridge, MA 02142, USA.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA., Zhang D; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA.; MIT-IBM Watson AI Lab, 75 Binney St., Cambridge, MA 02142, USA., Ross FM; MIT-IBM Watson AI Lab, 75 Binney St., Cambridge, MA 02142, USA.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA., Li J; MIT-IBM Watson AI Lab, 75 Binney St., Cambridge, MA 02142, USA.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA.; Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA., Yildiz B; MIT-IBM Watson AI Lab, 75 Binney St., Cambridge, MA 02142, USA.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA.; Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA., Del Alamo JA; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139, USA.; MIT-IBM Watson AI Lab, 75 Binney St., Cambridge, MA 02142, USA.
Publikováno v:
Science (New York, N.Y.) [Science] 2022 Jul 29; Vol. 377 (6605), pp. 539-543. Date of Electronic Publication: 2022 Jul 28.
Autor:
Onen M; IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States.; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, United States., Gokmen T; IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States., Todorov TK; IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States., Nowicki T; IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States., Del Alamo JA; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, United States., Rozen J; IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States., Haensch W; IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States., Kim S; IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States.
Publikováno v:
Frontiers in artificial intelligence [Front Artif Intell] 2022 May 09; Vol. 5, pp. 891624. Date of Electronic Publication: 2022 May 09 (Print Publication: 2022).
Autor:
Onen M; Microsystems Technology Laboratories, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.; MIT-IBM Watson AI Lab, 75 Binney Street, Cambridge, Massachusetts 02142, United States., Emond N; MIT-IBM Watson AI Lab, 75 Binney Street, Cambridge, Massachusetts 02142, United States.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States., Li J; MIT-IBM Watson AI Lab, 75 Binney Street, Cambridge, Massachusetts 02142, United States.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.; Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States., Yildiz B; MIT-IBM Watson AI Lab, 75 Binney Street, Cambridge, Massachusetts 02142, United States.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.; Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States., Del Alamo JA; Microsystems Technology Laboratories, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.; MIT-IBM Watson AI Lab, 75 Binney Street, Cambridge, Massachusetts 02142, United States.
Publikováno v:
Nano letters [Nano Lett] 2021 Jul 28; Vol. 21 (14), pp. 6111-6116. Date of Electronic Publication: 2021 Jul 07.
Autor:
Zhou, Qingqing1 (AUTHOR), Ding, Qihang2 (AUTHOR), Geng, Zixun1 (AUTHOR), Hu, Chencheng1 (AUTHOR), Yang, Long1 (AUTHOR), Kan, Zitong1 (AUTHOR), Dong, Biao1 (AUTHOR), Won, Miae2,3 (AUTHOR), Song, Hongwei1 (AUTHOR), Xu, Lin1 (AUTHOR) linxu@jlu.edu.cn, Kim, Jong Seung2,3 (AUTHOR) jongskim@korea.ac.kr
Publikováno v:
Nano-Micro Letters. 10/25/2024, Vol. 17 Issue 1, p1-20. 20p.
Autor:
Yao X; Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA., Klyukin K; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA., Lu W; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA., Onen M; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA., Ryu S; Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA., Kim D; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA., Emond N; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA., Waluyo I; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, 11973, USA., Hunt A; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, 11973, USA., Del Alamo JA; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA. alamo@mit.edu., Li J; Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA. liju@mit.edu.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA. liju@mit.edu., Yildiz B; Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA. byildiz@mit.edu.; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA. byildiz@mit.edu.
Publikováno v:
Nature communications [Nat Commun] 2020 Jun 19; Vol. 11 (1), pp. 3134. Date of Electronic Publication: 2020 Jun 19.
Autor:
Lu W; Microsystems Technology Laboratories , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States., Lee Y; Department of Chemistry , University of Colorado , Boulder , Colorado 80309 , United States., Gertsch JC; Department of Chemistry , University of Colorado , Boulder , Colorado 80309 , United States., Murdzek JA; Department of Chemistry , University of Colorado , Boulder , Colorado 80309 , United States., Cavanagh AS; Department of Chemistry , University of Colorado , Boulder , Colorado 80309 , United States., Kong L; Microsystems Technology Laboratories , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States., Del Alamo JA; Microsystems Technology Laboratories , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States., George SM; Department of Chemistry , University of Colorado , Boulder , Colorado 80309 , United States.
Publikováno v:
Nano letters [Nano Lett] 2019 Aug 14; Vol. 19 (8), pp. 5159-5166. Date of Electronic Publication: 2019 Jul 02.
Autor:
Yin Z; Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA 02139, USA.; Research School of Chemistry, The Australian National University, Canberra, Australian Capital Territory 2601, Australia., Tordjman M; Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA 02139, USA.; Solid State Institute and Physics Department, Technion-Israel Institute of Technology, Haifa 32000, Israel., Lee Y; Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA 02139, USA., Vardi A; Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA 02139, USA., Kalish R; Solid State Institute and Physics Department, Technion-Israel Institute of Technology, Haifa 32000, Israel., Del Alamo JA; Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA 02139, USA.
Publikováno v:
Science advances [Sci Adv] 2018 Sep 28; Vol. 4 (9), pp. eaau0480. Date of Electronic Publication: 2018 Sep 28 (Print Publication: 2018).
Autor:
Jeon, Seonuk1 (AUTHOR), Tessler, Nir2,3 (AUTHOR), Kim, Nayeon1 (AUTHOR), Hong, Eunryeong1 (AUTHOR), Kim, Hyun Wook1 (AUTHOR), Woo, Jiyong1 (AUTHOR) jiyong.woo@knu.ac.kr
Publikováno v:
Scientific Reports. 3/4/2024, Vol. 14 Issue 1, p1-7. 7p.