Zobrazeno 1 - 10
of 372
pro vyhledávání: '"Dekoster, J"'
Autor:
Hikavyy, A., Vanherle, W., Vincent, B., Dekoster, J., Bender, H., Moussa, A., Witters, L., Hoffman, T., Loo, R.
Publikováno v:
In Thin Solid Films 1 February 2012 520(8):3179-3184
Autor:
Lin, C.A., Chiu, H.C., Chiang, T.H., Chang, Y.C., Lin, T.D., Kwo, J., Wang, W.-E., Dekoster, J., Heyns, M., Hong, M.
Publikováno v:
In Journal of Crystal Growth 15 May 2011 323(1):99-102
Publikováno v:
In Microelectronic Engineering
Autor:
Vincent, B., Shimura, Y., Takeuchi, S., Nishimura, T., Eneman, G., Firrincieli, A., Demeulemeester, J., Vantomme, A., Clarysse, T., Nakatsuka, O., Zaima, S., Dekoster, J., Caymax, M., Loo, R.
Publikováno v:
In Microelectronic Engineering 2011 88(4):342-346
Autor:
Merckling, C., Chang, Y.C., Lu, C.Y., Penaud, J., El-Kazzi, M., Bellenger, F., Brammertz, G., Hong, M., Kwo, J., Meuris, M., Dekoster, J., Heyns, M.M., Caymax, M.
Publikováno v:
In Microelectronic Engineering 2011 88(4):399-402
Defect density reduction of the Al 2O 3/GaAs(001) interface by using H 2S molecular beam passivation
Autor:
Merckling, C., Chang, Y.C., Lu, C.Y., Penaud, J., Brammertz, G., Scarrozza, M., Pourtois, G., Kwo, J., Hong, M., Dekoster, J., Meuris, M., Heyns, M., Caymax, M.
Publikováno v:
In Surface Science June 2011
Autor:
Vincent, B., Loo, R., Vandervorst, W., Delmotte, J., Douhard, B., Valev, V.K., Vanbel, M., Verbiest, T., Rip, J., Brijs, B., Conard, T., Claypool, C., Takeuchi, S., Zaima, S., Mitard, J., De Jaeger, B., Dekoster, J., Caymax, M.
Publikováno v:
In Solid State Electronics 2011 60(1):116-121
Autor:
Takeuchi, S., Shimura, Y., Nishimura, T., Vincent, B., Eneman, G., Clarysse, T., Demeulemeester, J., Vantomme, A., Dekoster, J., Caymax, M., Loo, R., Sakai, A., Nakatsuka, O., Zaima, S.
Publikováno v:
In Solid State Electronics 2011 60(1):53-57
Autor:
Wang, G., Leys, M.R., Nguyen, N.D., Loo, R., Brammertz, G., Richard, O., Bender, H., Dekoster, J., Meuris, M., Heyns, M.M., Caymax, M.
Publikováno v:
In Journal of Crystal Growth 2011 315(1):32-36