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pro vyhledávání: '"Degree Of Polarization of the Photoluminescence (DOP PL)"'
Autor:
Ahammou, Brahim
Publikováno v:
Optics / Photonic. Université de Rennes; McMaster university (Hamilton, Canada), 2023. English. ⟨NNT : 2023URENS001⟩
Due to their attractive properties, silicon nitride (SiNx) based films have been recognized as essential dielectric films in the microelectronic and optoelectronic industries. In this PhD thesis, we describe how we can control the refractive index an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7af7a4c1b3ad4862ef3cf1f72cfd78e3
http://hdl.handle.net/11375/28285
http://hdl.handle.net/11375/28285
