A machine learning-based approach for picture acquisition timeslot prediction using defective pixels

Autor: Ahmed, Farah Nafees ^∗, Khelifi, Fouad, Lawgaly, Ashref, Bouridane, Ahmed

Publikováno v: In Forensic Science International: Digital Investigation December 2021 39

Investigating the influence of CdZnTe and HgCdTe material quality on detector image performance

Autor: Gong Yue, Minjie Shangguan, Chuanjie Zhang, Xin Wang, Hongyu Liang, Wenhui Yuan, Li Huang, Bing Yan, Haiou Xie, Bingjie Zhang, Huimin Zhang

Publikováno v: Journal of Materials Science: Materials in Electronics. 32:13177-13186

High-quality tellurium zinc cadmium (CZT) crystal materials and tellurium cadmium mercury (MCT) epitaxial materials are the key materials for the preparation of high-performance MCT-cooled detectors. Studying the relationship between material defects

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::beb9a1720b52b5da5b0f0749562cd689
https://doi.org/10.1007/s10854-021-05849-y

Defective pixel map creation based on wavelet analysis in digital radiography detectors

Autor: Park, Chun Joo ^a, Lee, Hyoung Koo ^b, Song, William Y. ^a, Achterkirchen, Thorsten Graeve ^c, Kim, Ho Kyung ^{d, ⁎}

Publikováno v: In Nuclear Inst. and Methods in Physics Research, A 2011 634(1):101-105

Detection, Location and Concealment of Defective Pixels in Image Sensors

Autor: Emmanuel Simeu, Ghislain Takam Tchendjou

Publikováno v: IEEE Transactions on Emerging Topics in Computing
IEEE Transactions on Emerging Topics in Computing, Institute of Electrical and Electronics Engineers, 2021, 9 (2), pp.664-679. ⟨10.1109/TETC.2020.2976807⟩

This paper presents the construction process of defective pixel detection and concealment methods, for image sensor online diagnosis and self-healing. The proposed process is based on pixel neighborhood analysis using only simple arithmetic operation

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::602ab6547de88ef96bfbb50710fe8e13
https://hal.archives-ouvertes.fr/hal-02948273

High-performance concealment of defective pixel clusters in infrared imagers

Autor: Qingsheng Xie, Gaopeng Zhang, Chiman Kwan, Jianzhong Cao, Yaohong Chen, Jin U. Kang

Publikováno v: Applied optics. 59(13)

Defective pixel concealment is a necessary procedure in infrared image processing and is widely used. However, current approaches are mainly focused on the concealment of isolated pixels and small defective pixel clusters. Consequently, these approac

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bd59468caf31e91d45ffeb989099c017
https://pubmed.ncbi.nlm.nih.gov/32400684