Zobrazeno 1 - 10
of 842
pro vyhledávání: '"Defective pixel"'
Autor:
López-Portilla, Bárbaro M.1 (AUTHOR), Valenzuela, Wladimir1 (AUTHOR), Zarkesh-Ha, Payman2 (AUTHOR), Figueroa, Miguel1 (AUTHOR) miguel.figueroa@udec.cl
Publikováno v:
Sensors (14248220). Jan2023, Vol. 23 Issue 2, p934. 21p.
Publikováno v:
Sensors, Vol 23, Iss 2, p 934 (2023)
Images produced by CMOS sensors may contain defective pixels due to noise, manufacturing errors, or device malfunction, which must be detected and corrected at early processing stages in order to produce images that are useful to human users and imag
Externí odkaz:
https://doaj.org/article/b661e396e8684644b2606894b5cdc195
Autor:
Çelik, Aslı1 (AUTHOR), Küçükmanisa, Ayhan1 (AUTHOR) ayhan.kucukmanisa@gmail.com, Sümer, Aydın1 (AUTHOR), Çelebi, Aysun Taşyapı1 (AUTHOR), Urhan, Oğuzhan1 (AUTHOR)
Publikováno v:
Journal of Intelligent Manufacturing. Apr2022, Vol. 33 Issue 4, p985-994. 10p.
Akademický článek
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Publikováno v:
Journal of Intelligent Manufacturing. 33:985-994
The presence of pixel defects on the screens of LCD-based products (TV, tablet, phone, etc.) is unacceptable given the consumer expectations. Therefore, these defects should be detected before the product reaches the user during the production stage.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::107511a793f1ae2eb481f43140d46fcf
https://doi.org/10.1007/s10845-020-01704-9
https://doi.org/10.1007/s10845-020-01704-9
Akademický článek
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Autor:
Park, Chun Joo, Lee, Hyoung Koo, Song, William Y., Achterkirchen, Thorsten Graeve, Kim, Ho Kyung
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, A 2011 634(1):101-105
Publikováno v:
Applied optics. 59(13)
Defective pixel concealment is a necessary procedure in infrared image processing and is widely used. However, current approaches are mainly focused on the concealment of isolated pixels and small defective pixel clusters. Consequently, these approac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bd59468caf31e91d45ffeb989099c017
https://pubmed.ncbi.nlm.nih.gov/32400684
https://pubmed.ncbi.nlm.nih.gov/32400684
Autor:
Yuan Xiaojun, Liu Yongji
Publikováno v:
2020 IEEE International Conference on Artificial Intelligence and Information Systems (ICAIIS).
This paper introduces the problem of defective pixel in the field of image sensor and several methods of defective pixel detection and correction for the problem of dynamic defective pixel. It proposes a design of dynamic defective pixel correction,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67c7e996f6317498366b8134464f64ed
https://doi.org/10.1109/icaiis49377.2020.9194921
https://doi.org/10.1109/icaiis49377.2020.9194921
Publikováno v:
37th IEEE VLSI Test Symposium (VTS 2019)
37th IEEE VLSI Test Symposium (VTS 2019), Apr 2019, Monterey, United States
VTS
37th IEEE VLSI Test Symposium (VTS 2019), Apr 2019, Monterey, United States
VTS
This paper presents an online and integrated solution for diagnosis and healing of the image sensors based on a defective pixel detection and concealment method. The proposed defective pixel detection method is based on the evaluation and analysis of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b639e2a56f527ed10a9376da911b37d5
https://hal.archives-ouvertes.fr/hal-02614553
https://hal.archives-ouvertes.fr/hal-02614553
