Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Deepu Roy"'
Publikováno v:
Dental Research Journal, Vol 11, Iss 2, Pp 222-227 (2014)
Background: Endodontic leakage research focus mainly on the quality of the apical seal of the root canal system and the newly introduced resilon/epiphany system claim to be superior to Gutta-percha in respect to obturation procedure. The aim of this
Externí odkaz:
https://doaj.org/article/84716b7e4b814f498922850837890b47
Publikováno v:
IEEE electron device letters, 31(11), 1293-1295. IEEE
For phase change random access memory (PCRAM) cells, it is important to know the contact resistance of phase change materials (PCMs) to metal electrodes at the contacts. In this letter, we report the systematic determination of the specific contact r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b84319a53a951208f56ccc60139b0d4d
https://doi.org/10.1109/led.2010.2066256
https://doi.org/10.1109/led.2010.2066256
Publikováno v:
2011 Proceedings of the 41st European Solid-State Device Research Conference (Essderc), 87-90
STARTPAGE=87;ENDPAGE=90;TITLE=2011 Proceedings of the 41st European Solid-State Device Research Conference (Essderc)
STARTPAGE=87;ENDPAGE=90;TITLE=2011 Proceedings of the 41st European Solid-State Device Research Conference (Essderc)
In this article we report on the change in contact resistance of TiW to doped-Sb 2 Te in the 5nm–50nm thickness range of the PCM layer. This interface is characterized both in the amorphous and in crystalline state of doped-Sb 2 Te. The nature of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a47dbfe05fd66fe9f0abbf73bebcf6cb
http://eprints.eemcs.utwente.nl/secure2/20555/01/Deepu.pdf
http://eprints.eemcs.utwente.nl/secure2/20555/01/Deepu.pdf
Publikováno v:
Proceedings of the 24th International Conference on Microelectronic Test Structures (ICMTS), 49-54
STARTPAGE=49;ENDPAGE=54;TITLE=Proceedings of the 24th International Conference on Microelectronic Test Structures (ICMTS)
STARTPAGE=49;ENDPAGE=54;TITLE=Proceedings of the 24th International Conference on Microelectronic Test Structures (ICMTS)
Knowledge of the interfacial contact impedance offered by the device at its operating frequency range is crucial for accurate modelling and understanding of the device. In this article, a novel modified TLM test-structure has been devised to extract
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a1d8c939a2f778dbef2e9b9bb885d147
https://doi.org/10.1109/icmts.2011.5976859
https://doi.org/10.1109/icmts.2011.5976859
Publikováno v:
Proceedings of 2011 MRS Spring Meeting, q03-02
STARTPAGE=q03;ENDPAGE=02;TITLE=Proceedings of 2011 MRS Spring Meeting
STARTPAGE=q03;ENDPAGE=02;TITLE=Proceedings of 2011 MRS Spring Meeting
We have investigated the interfacial contact properties of the CMOS compatible electrode materials W, TiW, Ta, TaN and TiN to doped-Sb2Te phase change material (PCM). This interface is characterized both in the amorphous and in the crystalline state
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f89629cf5b11a88459fa958ba44b2c6f
https://doi.org/10.1557/opl.2011.978
https://doi.org/10.1557/opl.2011.978
Publikováno v:
IEEE transactions on semiconductor manufacturing, 22(1):10.1109/TSM.2008.2010738, 96-102. IEEE
Planar inter-digitated comb capacitor structures are an excellent tool for on-chip capacitance measurement and evaluation of properties of coating layers with varying composition. These comb structures are easily fabricated in a single step in the la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::385f53d5c0f8fea73e77a10d2271f840
https://research.utwente.nl/en/publications/c7e7f882-e2b7-46d7-bba6-cd1e9d90a274
https://research.utwente.nl/en/publications/c7e7f882-e2b7-46d7-bba6-cd1e9d90a274
Publikováno v:
Proceedings of the 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures, 205-209
STARTPAGE=205;ENDPAGE=209;TITLE=Proceedings of the 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures
STARTPAGE=205;ENDPAGE=209;TITLE=Proceedings of the 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures
We present a simple comb capacitive measurement structure to monitor the properties of post-processed layers. These measurement structures are easily fabricated in a single step in the last metallization layer of a standard IC process, while the post
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::538a615eaeecffd79180739e33cf4a53
https://doi.org/10.1109/icmts.2008.4509339
https://doi.org/10.1109/icmts.2008.4509339