Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Deepika Neethirajan"'
Autor:
C. Alleyne, Deepika Neethirajan, Constantinos Xanthopoulos, S. Mier, E. De La Rosa, V. A. Niranjan, Yiorgos Makris
Publikováno v:
VTS
Post-fabrication performance calibration, a.k.a. trimming, is an essential part of analog/RF IC manufacturing and testing. Its objective is to counteract the impact of process variations by individually fine-tuning the performance parameters of every
Autor:
Ira Leventhal, Deepika Neethirajan, Yiorgos Makris, Keith Schaub, Constantinos Xanthopoulos, Ikeda Kosuke
Publikováno v:
ITC
Automated defect inspection in manufacturing of microscopic probes is an important task and often requires machine learning driven solutions. A supervised only approach can be challenging, because production manufacturing process typically have few d
Autor:
Yiorgos Makris, Kiruba Sankaran Subramani, Keith Schaub, Deepika Neethirajan, Constantinos Xanthopoulos, Ira Leventhal
Publikováno v:
VTS
We propose a machine learning-based solution for noise classification and decomposition in RF transceivers. Wireless transmitters are affected by various noise sources, each of which has a distinct impact on the signal constellation points. The propo
Autor:
Yiorgos Makris, Amit Nahar, Constantinos Xanthopoulos, Sirish Boddikurapati, Deepika Neethirajan
Publikováno v:
DATE
To combat the effects of process variation in modern, high-performance integrated Circuits (ICs), various post-manufacturing calibrations are typically performed. These calibrations aim to bring each device within its specification limits and ensure