Zobrazeno 1 - 10
of 65
pro vyhledávání: '"Deepak Varandani"'
Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy
Publikováno v:
Materials Research Express, Vol 7, Iss 1, p 016418 (2020)
In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors. Transmission electron microscopy (TEM) con
Externí odkaz:
https://doaj.org/article/28f194ede29d414cbe391b686cff4469
Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy
Publikováno v:
MATERIALS RESEARCH EXPRESS
In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/CuxSe bilayer interface prepared by multi-step deposition and selenization process of metal precursors. Transmission electron microscopy (TEM) confir
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::38ba5f7eac598d4ab91c020a0053285a
https://hdl.handle.net/10067/1678430151162165141
https://hdl.handle.net/10067/1678430151162165141
Autor:
Manoj Vishwakarma, Christian Andres, Deepak Varandani, Bodh Raj Mehta, Stefan G. Haass, Ayodhya N. Tiwari, Yaroslav E. Romanyuk
Publikováno v:
Solar Energy Materials and Solar Cells. 183:34-40
A direct mapping of photovoltage in a complete Mo/CZTSSe/CdS/ZnO/Al:ZnO solar cell device is carried out using Kelvin probe force microscopic (KPFM) measurements in surface and junction modes. Four cells having different values of open circuit voltag
Publikováno v:
Solar Energy Materials and Solar Cells. 174:577-583
Cu 2 ZnSiS 4 thin film has been synthesized using co-sputtering technique followed by sulphurization at 800 °C for 20 min. The relatively lower time of sulphurization employed are advantageous over earlier reported work in which the same material ha
Publikováno v:
Materials Today: Proceedings. 5:23281-23285
Copper Zinc Tin sulfide (CZTS) has shown promising performance as an absorber semiconductor for solar cell devices. Due to its multicomponent nature, low cost synthesis method results in presence of secondary phases, which is nagging issue it affects
Publikováno v:
Journal of Alloys and Compounds. 698:1058-1065
In the present study, thin films of Bi 2 Te 3 and Bi 2 Te 3 :Si nanocomposites, with varying concentration of Si, have been synthesized using co-sputtering technique. The effect of concentration of Si secondary phase segregated along Bi 2 Te 3 crysta
Publikováno v:
Springer Proceedings in Physics ISBN: 9783319976037
The effect of presence of MoS2 on the electrical and thermal conductivity of Bi2Te3 and Sb2Te3 has been studied. MoS2 nanoflake were observed to be randomly dispersed in the nanocomposite samples. The electrical conductivity of Sb2Te3:MoS2 was observ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a7b635c1e11bea320488ef7b38895b0
https://doi.org/10.1007/978-3-319-97604-4_17
https://doi.org/10.1007/978-3-319-97604-4_17
Publikováno v:
Springer Proceedings in Physics ISBN: 9783319976037
In the present study, chemical vapor deposited two-dimensional (2D) heterostructures are studied for their interesting electrical, and mechanical properties. The two-dimensional materials, molybdenum disulfide (MoS2) and Graphene are characterized ba
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d09e91676dc1a44c1670b1da4c7edf4c
https://doi.org/10.1007/978-3-319-97604-4_6
https://doi.org/10.1007/978-3-319-97604-4_6
Publikováno v:
Journal of Alloys and Compounds. 681:394-401
In the present study, the effect of the presence of monolayer graphene (G) on the nanoscale electrical and thermal conductivities of Bi 2 Te 3 has been investigated. Atomic force and conducting atomic force microscopic studies show that G incorporati
Publikováno v:
Journal of Nanoscience and Nanotechnology. 16:4044-4051
The phenomenon of resistive switching is based on nanoscale changes in the electrical properties of the interface. In the present study, conductive atomic force microscope based nanoscale measurements of copper oxide (CuO)-multilayer graphene (MLG) h