Zobrazeno 1 - 10 of 26 pro vyhledávání: '"Deelen, J. van"'
1
Benefit of Textured CIGS Cells for Low Reflecting Nanogrid Application
Autor: Deelen, J. van, Barink, M.
Publikováno v: 33rd European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2017, 25-29 September 2017, Amsterdam, 23-26
33rd European Photovoltaic Solar Energy Conference and Exhibition; 23-26
Metallization of the front contact can increase the conductivity. We show the optical benefit by combining nanowire with a texture of the thin film stack. The parallel nano
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2
Innovation for optical, electrical and economic improvement of thin-film PV technology
Autor: Deelen, J. van, Barink, M.
Publikováno v: Photovoltaics International, 35, 77-84
Innovation in the field of thin-film cells, in addition to economy of scale and the manufacturing learning curve, is an important element in keeping the price of this technology competitive. Most papers on these cells focus on their technology; howev
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3
Method and apparatus for depositing atomic layers on a substrate
Autor: Vermeer, A.J.P.M., Roozeboom, F., Deelen, J. van
Method of depositing an atomic layer on a substrate. the method comprises supplying a precursor gas fraom a precursor-gas supply of a deposition head that may be part of a rotatable drum. The precursor gas is provided from the presursor-gas supply to
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4
Benefit of textured CIGS cells for low reflecting nanogrid application
Autor: Deelen, J. van, Tezsevin, Y., Omar, A., Barink, M.
Publikováno v: MRS Advances, 53, 2, 3175-3180
We show the results of nanotextured device designs combined with carefully placed nanogrids in order to minimize optical losses. Finite element method (FEM) based optical modeling indicates that the reflection of both the layer stack and the metal is
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5
Fast Processing of Sol-Gel TCO
Autor: Deelen, J. van, Rem, M., Arfsten, N., Buskens, P.P.
Publikováno v: Proceedings 32nd European Photovoltaic Solar Energy Conference and Exhibition EU PVSEC, 96, 9, 155-157
32nd European Photovoltaic Solar Energy Conference and Exhibition; 155-157
TCOs are usually deposited using sputtering or chemical vapor deposition, which have a yield of typically 50-75%. The sol gel method does not need low pressure and can be
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6
Routes to increasing efficiency and reducing the cost of thin-film solar panels
Autor: Deelen, J. van, Barink, M., Klerk, L., Voorthuijzen, P., Hovestad, A.
Publikováno v: Photovoltaics International, 46-52
Most development work in the laboratory is dedicated to efficiency enhancements at the cell level; improvements in efficiency can lead to higher cost-competitiveness of PV. However, the cost of panel manufacturing is an important aspect as well. For
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7
Efficiency loss prevention in monolithically integrated thin film solar cells by improved front contact
Autor: Deelen, J. van, Barink, M., Klerk, L., Voorthuijzen, P., Hovestad, A.
Publikováno v: Progress in Photovoltaics: Research and Applications, 4, 23, 498-506
Modeling indicates a potential efficiency boost of 17% if thin-film solar panels are featured with a metallic grid. Variations of transparent conductive oxide sheet resistance, cell length, and grid dimensions are discussed. These parameters were opt
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8
Study of wet chemical etching of AlxGa1-xInP2 films using hydrochloric acid
Autor: Deelen, J. van, Mulder, P., Bauhuis, G.J., Niftrik, A.T.J. van, Haverkamp, E., Schermer, J.J., Larsen, P.K.
Publikováno v: Journal of the Electrochemical Society, 153, 6, pp. C442-C448
Journal of the Electrochemical Society, 153, C442-C448
Contains fulltext : 35375.pdf (Publisher’s version ) (Closed access)
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https://hdl.handle.net/2066/35375
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10
APCVD of ZnO: Al, insight and control by modeling
Autor: Deelen, J. van, Illiberi, A., Kniknie, B.J., Steijvers, H.L.A.H., Lankhorst, A.M., Simons, P.J.P.M.
Publikováno v: Surface and Coatings Technology, 230, 239-244
Atmospheric pressure chemical vapor deposition (APCVD) of ZnO from diethyl zinc (DEZn) and t-butanol was performed using an industrial reactor design. Deposition profiles were recorded to gain insight in the position dependent variations in layer thi
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