Výsledky vyhledávání - "Deeb, Chris"

Akademický článek

13nm gate Intentional Defect Array (IDA) wafer patterning by e-beam lithography for defect metrology evaluation

Autor: Raghunathan, Ananthan, Bennett, Steve, Stamper, Harlem O., Hartley, John G., Arceo, Abraham, Johnson, Mark, Deeb, Chris, Patel, Dilip, Nadeau, Jim

Publikováno v: In Microelectronic Engineering August 2011 88(8):2729-2731

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Akademický článek

The mechanical properties of polycrystalline 3C-SiC films grown on polysilicon substrates by atmospheric pressure chemical-vapor deposition.

Autor: Roy, Shuvo, Zorman, Christian, Mehregany, Mehran, DeAnna, Russell, Deeb, Chris

Publikováno v: Journal of Applied Physics; 2/15/2006, Vol. 99 Issue 4, p044108, 13p, 7 Black and White Photographs, 4 Diagrams, 4 Charts, 6 Graphs

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Akademický článek

Anodic Oxidation During MEMS Processing of Silicon and Polysilicon: Native Oxides Can Be Thicker Than You Think.

Autor: Kahn, Harold, Deeb, Chris, Chasiotis, Ioannis, Heuer, Arthur H.

Publikováno v: Journal of Microelectromechanical Systems; Oct2005, Vol. 14 Issue 5, p914-923, 10p

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Periodical

Characterization of ultrathin films by laser-induced sub-picosecond photoacoustics with coherent extreme ultraviolet detection

Autor: Li, Qing, Hoogeboom-Pot, Kathleen, Nardi, Damiano, Deeb, Chris, King, Sean, Tripp, Marie, Anderson, Erik, Murnane, Margaret M., Kapteyn, Henry C.

Publikováno v: Proceedings of SPIE; March 2012, Vol. 8324 Issue: 1 p83241P-83241P-8, 749178p

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Periodical

Characterization Scheme for III-V Junction Development

Autor: Hung, Pui Yee, McDonough, Colin, Geer, Robert, Hill, Richard J., Deeb, Chris, Rader, K., Jammy, Raj

Publikováno v: ECS Transactions; April 2011, Vol. 35 Issue: 3

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