Zobrazeno 1 - 10
of 62
pro vyhledávání: '"Debra L. Kaiser"'
Autor:
David J Michael, Denis K Koltsov, Gert Roebben, Angela R. Hight Walker, Vincent A. Hackley, Jean-Marc Aublant, Debra L. Kaiser, Jan Herrmann, Akira Ono, Charles A. Clifford, Emeric Frejafon, Toshiyuki Fujimoto, Gregory J. Smallwood, Naoyuki Taketoshi
Publikováno v:
ACS Nano. 14:14255-14257
Autor:
Andriy Zakutayev, Caleb Phillips, Shijing Sun, Brian L. DeCost, Jason R. Hattrick-Simpers, Winnie Wong-Ng, A. Gilad Kusne, Howie Joress, Ichiro Takeuchi, Debra L. Kaiser, Heshan Yu, Janak Thapa, Tonio Buonassisi
Publikováno v:
Springer International Publishing
Modern machine learning and autonomous experimentation schemes in materials science rely on accurate analysis of the data ingested by these models. Unfortunately, accurate analysis of the underlying data can be difficult, even for domain experts, com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::13012f7a4178c4df029b905e4cf06490
https://hdl.handle.net/1721.1/136823
https://hdl.handle.net/1721.1/136823
In the past decade, numerous public and private sector documents have highlighted the need for materials data to facilitate advanced technologies in myriad industrial and economic sectors. These documents have been analyzed to identify prevalent gaps
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3354dda2d783a511467a62a405ab19f
https://doi.org/10.6028/nist.ir.8364
https://doi.org/10.6028/nist.ir.8364
NIST is leading the development of the Research Data Framework (RDaF) with involvement and input from national and international leaders in the broad research data stakeholder community. Research data is defined here as the recorded factual material
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6cf7e6f342b5232ccd1adb10f1f45694
https://doi.org/10.6028/nist.sp.1500-18
https://doi.org/10.6028/nist.sp.1500-18
Autor:
Jean-Marc, Aublant, Charles A, Clifford, Emeric, Frejafon, Toshiyuki, Fujimoto, Vincent A, Hackley, Jan, Herrmann, Angela R, Hight Walker, Debra L, Kaiser, Denis K, Koltsov, David J, Michael, Akira, Ono, Gert, Roebben, Gregory J, Smallwood, Naoyuki, Taketoshi
Publikováno v:
ACS nano. 14(11)
For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including
Publikováno v:
Metrology and Standardization of Nanotechnology: Protocols and Industrial Innovations
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc80d1d5c05f12f229fdac8563f5b7cc
https://doi.org/10.1002/9783527800308
https://doi.org/10.1002/9783527800308
Autor:
Kathleen Chalfin, Debra L. Kaiser
Publikováno v:
Metrology and Standardization of Nanotechnology
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a293c184b3fe3e3506098b65c7dc91fc
https://doi.org/10.1002/9783527800308.ch15
https://doi.org/10.1002/9783527800308.ch15