Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Debi Dutta"'
Publikováno v:
IEEE Open Journal of Antennas and Propagation, Vol 4, Pp 461-471 (2023)
This work addresses a concern of aperture coupled microstrip patch which is commonly overlooked. Such feeding configuration is typically believed to be immune to high cross-polar (XP) radiations, which indeed is a paradox. It actually offers consider
Externí odkaz:
https://doaj.org/article/9a4c8da90b474ccc907004438223678e
Publikováno v:
In Multiple Sclerosis and Related Disorders December 2023 80
Publikováno v:
IEEE Transactions on Antennas and Propagation. 70:2295-2300
This work explores an idea of modifying surface current distribution in a rectangular microstrip patch which contributes to reducing its H-plane cross-polarized (XP) radiations along with minimizing the backside radiation to some extent. A pair of gr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::807f0a49d4f156299006823b5cc02229
https://doi.org/10.1109/tap.2021.3111158
https://doi.org/10.1109/tap.2021.3111158
Publikováno v:
2022 IEEE Microwaves, Antennas, and Propagation Conference (MAPCON).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::adf49eb741da7d97ceb08675695403b6
https://doi.org/10.1109/mapcon56011.2022.10047526
https://doi.org/10.1109/mapcon56011.2022.10047526
Autor:
Debi Dutta, Debatosh Guha
Publikováno v:
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fc116730ce70a253b073a8b52b8c15b5
https://doi.org/10.1109/ap-s/usnc-ursi47032.2022.9886742
https://doi.org/10.1109/ap-s/usnc-ursi47032.2022.9886742
Publikováno v:
IEEE Antennas and Wireless Propagation Letters. 20:678-682
This letter explores a new concept for the first time to control a specific unwanted higher mode in a microstrip patch with a target to reduce its cross-polarized (XP) radiation over the orthogonal plane. A strategic metal pole has been introduced to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11b234976345903317ea42c4cfd92ee2
https://doi.org/10.1109/lawp.2021.3060064
https://doi.org/10.1109/lawp.2021.3060064
Publikováno v:
IEEE Antennas and Wireless Propagation Letters. 19:99-103
This letter explores a novel technique to minimize cross-polarized (XP) fields of a microstrip patch across all radiation planes. This inherent issue is more challenging to mitigate over the skewed, i.e., around the diagonal plane of radiation. A pos
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ce1f95554afed2eeb5ff380344c9c2ee
https://doi.org/10.1109/lawp.2019.2954215
https://doi.org/10.1109/lawp.2019.2954215
Publikováno v:
2021 IEEE Indian Conference on Antennas and Propagation (InCAP).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac17237de8890e35756f5bb149e58da6
https://doi.org/10.1109/incap52216.2021.9726507
https://doi.org/10.1109/incap52216.2021.9726507
Publikováno v:
2021 International Conference on Microwave and Millimeter Wave Technology (ICMMT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::23f849cd35fe13617018f085a38a60df
https://doi.org/10.1109/icmmt52847.2021.9618144
https://doi.org/10.1109/icmmt52847.2021.9618144
Interesting Behavior of Rectangular Microstrip Patch with Specific Perturbations on the Ground Plane
Autor:
Debi Dutta, Debatosh Guha
Publikováno v:
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting.
A kind of metallic perturbation on the ground plane of a microstrip patch has been examined indicating some interesting as well as useful features. A strategic geometry, its location, and dimension can magically improve the pattern symmetry and also
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c86d07b3cf600f6864348ff239e8b5d
https://doi.org/10.1109/ieeeconf35879.2020.9329485
https://doi.org/10.1109/ieeeconf35879.2020.9329485