Zobrazeno 1 - 10
of 60
pro vyhledávání: '"Debbie J, Stokes"'
Publikováno v:
Micron. 50:51-56
Focused ion beam (FIB) microscopy uses Ga + ions to remove material from a sample for a variety of imaging and preparation techniques. While considerable work has examined the effects of FIB exposure on a number of materials, optimized FIB conditions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fa2f0125ab79fcafc49574f7f37f882
https://doi.org/10.1016/j.micron.2013.04.005
https://doi.org/10.1016/j.micron.2013.04.005
Autor:
M. J. Galtrey, Debbie J. Stokes, Peter H. Clifton, Menno J. Kappers, Alfred Cerezo, Colin J. Humphreys, Rachel A. Oliver
An InxGa1−xN∕GaN multiple quantum well (MQW) structure that exhibited bright photoluminescence was examined with the three-dimensional atom probe. The quantum wells were clearly imaged and the indium fraction x measured to be 0.19±0.01, in good
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7651d9064271f9270be07f9159258d84
https://doi.org/10.1063/1.2431573
https://doi.org/10.1063/1.2431573
Autor:
David M. Bulmer, Nicholas M. Thomson, Andrew J. Grant, Athene M. Donald, Debbie J. Stokes, Easan Sivaniah, Anjam C. M. Khan, Lech Staniewicz
Publikováno v:
Scanning. 34:237-246
Transmission imaging with an environmental scanning electron microscope (ESEM) (Wet STEM) is a recent development in the field of electron microscopy, combining the simple preparation inherent to ESEM work with an alternate form of contrast available
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c9b9de5628220395091a60eaa656caa4
https://doi.org/10.1002/sca.21000
https://doi.org/10.1002/sca.21000
Publikováno v:
Journal of Nanoscience and Nanotechnology. 9:1268-1271
Techniques for characterisation and methods for fabrication at the nanoscale are becoming more powerful, giving new insights into the spatial relationships between nanostructures and greater control over their development. A case in point is the appl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d33e6027615b2f56e68b72bb79fef902
https://doi.org/10.1166/jnn.2009.c135
https://doi.org/10.1166/jnn.2009.c135
Autor:
Oliver Wilhelmi, Debbie J. Stokes, Laurent Roussel, Steve Reyntjens, D Hubert, Christoph Mitterbauer
Publikováno v:
Japanese Journal of Applied Physics. 47:5010-5014
State-of-the-art focused ion beam (FIB) technology combined with high-performance scanning electron microscopy (SEM) is making a big impact on nanotechnology, particularly with the ability to use either focused ions or electrons to perform advanced n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e572cc4fee6e6e6311a1dc654b9452d7
https://doi.org/10.1143/jjap.47.5010
https://doi.org/10.1143/jjap.47.5010
Publikováno v:
Journal of Physics: Conference Series. 26:50-53
Over the last decade techniques such as confocal light microscopy, in combination with fluorescent labelling, have helped biologists and life scientists to study biological architectures at tissue and cell level in great detail. Meanwhile, obtaining
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14e2c10fe320bb2b40d7f03a34052d2d
https://doi.org/10.1088/1742-6596/26/1/012
https://doi.org/10.1088/1742-6596/26/1/012
Autor:
Lopes, William Bonfield, Debbie J. Stokes, José D. Santos, Neil Rushton, Roger A. Brooks, Serena M. Best, Cláudia Botelho
Publikováno v:
Materials Science Forum. :378-382
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c54f88fc3286d5694e9f00cd8e7159a
https://doi.org/10.4028/www.scientific.net/msf.455-456.378
https://doi.org/10.4028/www.scientific.net/msf.455-456.378
Autor:
Debbie J. Stokes
Publikováno v:
Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences. 361:2771-2787
One of the latest developments in electron microscopy is the environmental scanning electron microscope (ESEM), which enables soft, moist and/or electrically insulating materials to be viewed without pre-treatment, unlike conventional scanning electr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b15fdd72fa3e675cdbb917c853457daa
https://doi.org/10.1098/rsta.2003.1279
https://doi.org/10.1098/rsta.2003.1279
Autor:
Debbie J. Stokes
Publikováno v:
Advanced Engineering Materials. 3:126-130
Soft condensed matter and delicate specimens represent a wide class of materials including foods, pharmaceuticals, personal care products, polymeric coatings, gels, colloidal dispersions, emulsions and other complex fluids, biological specimens, and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be335b8b26070fd024202366c018011f
https://doi.org/10.1002/1527-2648(200103)3:3<126::aid-adem126>3.0.co
https://doi.org/10.1002/1527-2648(200103)3:3<126::aid-adem126>3.0.co
Autor:
Ellen Baken, Debbie J. Stokes
Publikováno v:
Imaging & Microscopy. 9:18-20
Imaging of soft matter, including polymeric and biological materials, has always been one of the big challenges in electron microscopy, due to the electrically insulating properties and radiation/vacuum-sensitive nature of such specimens. We briefly
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8c52d20b793b498020ecb6ac22f6d932
https://doi.org/10.1002/imic.200790139
https://doi.org/10.1002/imic.200790139