Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Debao Wei"'
Publikováno v:
IEEE Access, Vol 7, Pp 94332-94341 (2019)
In view of the demand for the different output power of generators in the relevant test projects during the flight test, this paper proposes a real-time aircraft electric simulative load system based on CompactRIO (cRIO)-embedded controller, which ca
Externí odkaz:
https://doaj.org/article/4fa5dd7dacd44f9caa721567a700cc13
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 31:861-873
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3726868c26c697261e2ec67d3b11a762
https://doi.org/10.1109/tvlsi.2023.3249183
https://doi.org/10.1109/tvlsi.2023.3249183
Publikováno v:
Journal of Porous Media. 26:47-69
Foams in pores affect the sweep range and oil displacement efficiency for low-permeability reservoir. In this paper, regular porous media with different coordination numbers are constructed to study how the parameters of microscopic pore structure af
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c15f4d651c031c436c8138cf5ee9563b
https://doi.org/10.1615/jpormedia.2022041689
https://doi.org/10.1615/jpormedia.2022041689
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:5299-5312
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83200ae35bacf80a7415bf43d3ee7a00
https://doi.org/10.1109/tcad.2022.3155380
https://doi.org/10.1109/tcad.2022.3155380
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:3543-3547
With the increasing density of flash memory, its service life is declining. As the most important technical index of a flash device, flash retention parameters often need to consume a substantial amount of time to be tested. With a view toward reduci
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4dd3e18185c57067d6dedf7bd0b70402
https://doi.org/10.1109/tcad.2021.3127860
https://doi.org/10.1109/tcad.2021.3127860
Publikováno v:
IEEE Transactions on Device and Materials Reliability. :1-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ef7a052bbddf8f4f71b7e2277931256
https://doi.org/10.1109/tdmr.2023.3280262
https://doi.org/10.1109/tdmr.2023.3280262
Publikováno v:
2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::87d3f879c78e5d5c90c785869b0b81d4
https://doi.org/10.1109/icemi52946.2021.9679547
https://doi.org/10.1109/icemi52946.2021.9679547
Publikováno v:
IEEE Access, Vol 7, Pp 94332-94341 (2019)
In view of the demand for the different output power of generators in the relevant test projects during the flight test, this paper proposes a real-time aircraft electric simulative load system based on CompactRIO (cRIO)-embedded controller, which ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1c28f45829fe51d52fa3877d5f87b0cb
https://ieeexplore.ieee.org/document/8759969/
https://ieeexplore.ieee.org/document/8759969/
Publikováno v:
I2MTC
Wind tunnel balances, as the most important equipment in wind tunnel force testing, are responsible for the measurement of raw aerodynamic data in aerodynamic experiments. A multi-channel data acquisition system was designed to meet the needs of wind
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1fdf53925a2384a34634582bed446568
https://doi.org/10.1109/i2mtc50364.2021.9460072
https://doi.org/10.1109/i2mtc50364.2021.9460072
Publikováno v:
Microprocessors and Microsystems. 60:65-76
With the aggressive scaling and the Multi-Level Cell (MLC) technology, the reliability of NAND flash degrades seriously. Therefore, the traditional error correction schemes are becoming less and less effective. Low-Density Parity-Check (LDPC) code an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f4e3357ec2097f40662bf2d8d5b0aa15
https://doi.org/10.1016/j.micpro.2018.04.001
https://doi.org/10.1016/j.micpro.2018.04.001