New modeling approach of on‐chip interconnects for RF integrated circuits in CMOS technology

Autor: Ymeri, H., Nauwelaers, B., Maex, K., De Roest, D.

Publikováno v: Microelectronics International: An International Journal, 2003, Vol. 20, Issue 3, pp. 41-44.

Externí odkaz: http://www.emeraldinsight.com/doi/10.1108/13565360310487945

Highly accurate closed form approximation for frequency-dependent line impedance of a lossy silicon substrate IC interconnect

Autor: Ymeri, H ^∗, Nauwelaers, B, Maex, K, De Roest, D, Stucchi, M

Publikováno v: In Microelectronic Engineering 2002 60(1):31-37

Modeling the Substrate Skin Effects in Mutual RL Characteristics

Autor: Ymeri, Hasan, Nauwelaers, B., Maex, Karen, de Roest, D.

Publikováno v: Radioengineering, Vol 12, Iss 4, Pp 21-25 (2003)
Radioengineering. 2003, vol. 12, č. 4, s. 21-25. ISSN 1210-2512

The goal of this work was to model the influence of the substrate skin effects on the distributed mutual impedance per unit length parameters of multiple coupled on-chip interconnects. The proposed analytic model is based on the frequency-dependent d

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7584dacb55adf851a2621720af594eb7
http://www.radioeng.cz/fulltexts/2003/03_04_21_25.pdf

Dielectric Reliability of 50nm Half Pitch Structures in Aurora® LK

Autor: Demuynck, S., Kim, H., Huffman, C., Darnon, Maxime, Struyf, H., Versluijs, J., Claes, M., Vereecke, G., Verdonck, P., Volders, H., Heylen, N., Kellens, K., De Roest, D., Sprey, H., Beyer, G.

Publikováno v: Japanese Journal of Applied Physics
Japanese Journal of Applied Physics, 2009, 48, April 2009, 04C018
Japanese Journal of Applied Physics, Japan Society of Applied Physics, 2009, 48, April 2009, 04C018

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a249f6f0dbce423c384233ed69ca0138
https://hal.science/hal-00625298

Analysis of Coplanar On-Chip Interconnects on Lossy Semiconducting Substrates

Autor: Ymeri, H., Nauwelaers, B., Maex, K., Vandenberghe, S., de Roest, D., Stucchi, M.

Publikováno v: Radioengineering. 2002, vol. 11, č. 1, s. 1-5. ISSN 1210-2512

In this paper, a method for analysis and modeling of coplanar transmission interconnect lines that are placed on top of silicon-silicon oxide substrates is presented. The potential function is expressed by series expansions in terms of solutions of t

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______2852::ba0c6ac6a3990b27bd42132d7752a1aa
https://hdl.handle.net/11012/58134