Zobrazeno 1 - 10
of 30
pro vyhledávání: '"De Miguel, J. L."'
Publikováno v:
Journal of Applied Physics; 5/15/1991, Vol. 69 Issue 10, p7021, 8p
Autor:
Shibli, S. M., Tamargo, M. C., De Miguel, J. L., Skromme, B. J., Nahory, R. E., Farrell, H. H.
Publikováno v:
Journal of Applied Physics; 11/1/1989, Vol. 66 Issue 9, p4295, 6p
Publikováno v:
Journal of Applied Physics; 5/15/1989, Vol. 65 Issue 10, p3999, 7p, 2 Charts, 7 Graphs
Autor:
de Miguel, J. L.
Publikováno v:
Informes de la Construcción; Vol. 50 No. 456-457 (1998); 81-87
Informes de la Construcción; Vol. 50 Núm. 456-457 (1998); 81-87
Informes de la Construcción
Consejo Superior de Investigaciones Científicas (CSIC)
Informes de la Construcción; Vol. 50 Núm. 456-457 (1998); 81-87
Informes de la Construcción
Consejo Superior de Investigaciones Científicas (CSIC)
In architectural works, structural calculations are usually few and simple, they mostly corroborate what is already known. Calculations are made for the most part with the purpose of exploring solutions. When working in a specific case operations oug
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=RECOLECTA___::3c234dff24a7b660e43c0f9cd3439576
https://informesdelaconstruccion.revistas.csic.es/index.php/informesdelaconstruccion/article/view/889
https://informesdelaconstruccion.revistas.csic.es/index.php/informesdelaconstruccion/article/view/889
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1988, Vol. 6 Issue 2, p784-787, 4p
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1985, Vol. 3 Issue 2, p568-571, 4p
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1988, Vol. 6 Issue 6, p1889-1891, 3p
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1988, Vol. 6 Issue 2, p617-619, 3p
Publikováno v:
Applied Physics Letters; 11/28/1988, Vol. 53 Issue 22, p2217, 3p
Publikováno v:
Applied Physics Letters; 11/21/1988, Vol. 53 Issue 21, p2065, 3p