Stopping Criteria for Less Expensive and High Quality MC-Based Analog IC Yield Optimization

Autor: Liu, Bo, Fernandez, Francisco V, De Jonghe, Dimitri, Gielen, Georges

This paper investigates the stopping criteria for Monte-Carlo (MC)-based yield optimization of analog integrated circuits. Available stopping criteria are briefly reviewed and a new adaptive criterion, called combined global and local improvement (Co

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______1131::2c7129a03ab0a9acfc22f8948993686e
https://lirias.kuleuven.be/handle/123456789/255624

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