Heavy-ion micro-beam use for transient fault injection in VLSI circuits.

Autor: Sondon, Santiago, Mandolesi, Pablo, Julian, Pedro, Vega, Nahuel, Palumbo, Felix, De Bray, Mario

Publikováno v: 2014 IEEE 41st International Conference on Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS); 2014, p1-1, 1p