Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Dayanasari Abdul Hadi"'
Autor:
Nurliyana Abd Mutalib, Norlezah Hashim, Nadzrie bin Mohamood, Mohd Syafiq Mispan, Shamsul Fakhar Abd Gani, Eliyana Ruslan, Dayanasari Abdul Hadi, Lai Len Fatt, Madiha Zahari, Mohd Farriz Basar, Wang Choon Seang, Hau Yong Kyan, Aminurrashid bin Noordin
Publikováno v:
2021 6th IEEE International Conference on Recent Advances and Innovations in Engineering (ICRAIE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f25fc9dd3a3d4d98e558c3a3448c885
https://doi.org/10.1109/icraie52900.2021.9703789
https://doi.org/10.1109/icraie52900.2021.9703789
Publikováno v:
Advanced Materials Research. :1862-1866
This paper presents the effects imposed on the reliability of advanced-process CMOS devices, specifically the NBTI degradation, subsequent to the integration of laser annealing (LA) in the process flow of a 45nm HfO2/TiN gate stack PMOS device. The l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a2777b00835fba2940738e42fef89f5
https://doi.org/10.4028/www.scientific.net/amr.189-193.1862
https://doi.org/10.4028/www.scientific.net/amr.189-193.1862
Autor:
Dayanasari Abdul Hadi, Norhayati Soin, S. F. Wan Muhamad Hatta, Abdul Manaf Hashim, Vijay K. Arora
Publikováno v:
AIP Conference Proceedings.
The effect of the negative bias temperature instability (NBTI) has been studied on the performance of the CMOS inverter using ELDO analog simulator. A simulation study had been conducted on a CMOS inverter using BSIM3V3 model and focused on the PMOS
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad8821293dfec3bf58b432b43f5a983b
https://doi.org/10.1063/1.3586980
https://doi.org/10.1063/1.3586980
Publikováno v:
2010 International Conference on Enabling Science and Nanotechnology (ESciNano).
It is well-known that the miniaturization or scaling down process of integrated circuits (ICs) has lead to the reliability issues such as Hot-Carrier (HC) and Negative Bias Temperature Instability (NBTI) effects which are very significant on p-type M
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a37348adb3c397dda68c0345b5d3ade
https://doi.org/10.1109/escinano.2010.5700968
https://doi.org/10.1109/escinano.2010.5700968
Autor:
Dayanasari Abdul Hadi, Norhayati Soin
Publikováno v:
2009 International Conference for Technical Postgraduates (TECHPOS).
In this paper, an overview of passive Ultra High Frequency (UHF) Radio Frequency Identification (RFID) is presented. This literature review emphasis on the analog front end part of the RFID transponder based on several published papers conducted by p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95f5ee3fcc43b497779ca39dc9dfa323
https://doi.org/10.1109/techpos.2009.5412054
https://doi.org/10.1109/techpos.2009.5412054