Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Davood Raoufi"'
Publikováno v:
Journal of Materials Chemistry A. 9:15381-15393
Highly efficient new binder-free bimetallic metal–organic framework (bi-MMOF) symmetric supercapacitors were fabricated. Besides, a new and influential strategy of surface statistical and morphological studies was developed to predict the superior
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::257f813dafd9f4521ff4c854c7249e7d
https://doi.org/10.1039/d1ta01724a
https://doi.org/10.1039/d1ta01724a
Publikováno v:
Colloids and Surfaces A: Physicochemical and Engineering Aspects. 656:130450
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d46e6b5d87d01e92062008e1c65d4d19
https://doi.org/10.1016/j.colsurfa.2022.130450
https://doi.org/10.1016/j.colsurfa.2022.130450
Autor:
Davood Raoufi, Leila Eftekhari
Publikováno v:
Surface Engineering. 35:618-626
Structural features and surface morphology of ZrO2 thin films electron beam evaporation-deposited under various oxygen partial pressure were studied. It was indicated tetragonal phase for all samples by XRD pattern. The highest crystallite size calcu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f67d13d30aee15daf939c86cbf5ed3c6
https://doi.org/10.1080/02670844.2018.1555913
https://doi.org/10.1080/02670844.2018.1555913
Autor:
Davood Raoufi, Ebrahim Hasani
Publikováno v:
Surface Engineering. 34:914-924
In this work, cadmium telluride (CdTe) nanoparticles-doped Ag was deposited on Ag wafer at 150°C and of 2 × 10−5 mbar. The thickness of thin films is 80 nm. The results of the XRD analysis ...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e654911e3b2238c9cb838768a879c705
https://doi.org/10.1080/02670844.2017.1401278
https://doi.org/10.1080/02670844.2017.1401278
Publikováno v:
Advances in Materials Physics and Chemistry. :42-57
In this study, Indium Tin Oxide (ITO) thin films were deposited by electron beam evaporation on white glass substrates with thicknesses of about 50, 100 and 170 nm. We investigated structural properties by X-ray Diffraction (XRD) and X-ray reflectivi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f55d5b0feecf87d91e5aa59fe70347ad
https://doi.org/10.4236/ampc.2017.72005
https://doi.org/10.4236/ampc.2017.72005
Autor:
Ebrahim Hasani, Davood Raoufi
Publikováno v:
Semiconductor Science and Technology. 36:055004
Thin films of cadmium telluride (CdTe) with a thickness of 550 nm were prepared using the thermal evaporation method. The resulting films were annealed in air atmosphere at 200 °C, 300 °C, 400 °C and 500 °C. The annealed films were subjected to x
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a9c2e577f6f02a95c8218716c576e008
https://doi.org/10.1088/1361-6641/abe318
https://doi.org/10.1088/1361-6641/abe318
Publikováno v:
The Journal of Physical Chemistry C. 120:18055-18065
Statistical, morphological, and fractal analyses of the conducting polypyrrole (PPy) thin films during polymer growth on the indium tin oxide (ITO) glass electrode were investigated. Cyclic voltammetry (CV) was used to synthesize polymer thin films w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e36cd9a1d2a349a37bc77bb934454399
https://doi.org/10.1021/acs.jpcc.6b04913
https://doi.org/10.1021/acs.jpcc.6b04913
Autor:
Bayan Karimi, Khadijeh Ranjbarghanei, Fayegh Hosseinpanahi, Davood Raoufi, Reza Babaei, Ebrahim Hasani
Publikováno v:
Applied Surface Science. 357:1843-1848
Cadmium telluride (CdTe) thin films were prepared by RF magnetron sputtering on glass substrates at room temperature (RT). The film deposition was performed for 5, 10, and 15 min at power of 30 W with a frequency of 13.56 MHz. The crystal structure o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e3720052b289e46b454c42dcf5b188dd
https://doi.org/10.1016/j.apsusc.2015.09.048
https://doi.org/10.1016/j.apsusc.2015.09.048
Publikováno v:
Electronic Materials Letters. 11:749-757
In this paper, based on atomic force microscopy (AFM) data the surface morphology of tin-doped In2O3 (ITO) thin films, prepared by electron beam deposition method on float glass substrates, was systematically investigated using the multifractal analy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f55698eb88724dd6780fbdb8d79d9d9
https://doi.org/10.1007/s13391-015-4280-1
https://doi.org/10.1007/s13391-015-4280-1
Autor:
Davood Raoufi, Leila Eftekhari
Publikováno v:
Surface and Coatings Technology. 274:44-50
In 2 O 3 :Sn (ITO) thin films with thickness of 200 nm were grown on glass substrates by electron beam evaporation method at different deposition rates. The deposition rate was adjusted in the range between 3 nm/min and 12 nm/min. X-ray diffraction (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0d66e0489db14eb89d2fcb7717b076e
https://doi.org/10.1016/j.surfcoat.2015.04.034
https://doi.org/10.1016/j.surfcoat.2015.04.034