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pro vyhledávání: '"Davit Shaljyan"'
Autor:
Suren Avushyan, Arsen Momjyan, Davit Shaljyan, Narek Shukhyan, Kamo O. Petrosyan, Lusine Mikaelyan, Taron Kaplanyan
Publikováno v:
2019 IEEE 39th International Conference on Electronics and Nanotechnology (ELNANO).
The paper studies the effects of high fin-numbers in FinFET devices, which have not been discussed before. The research has been conducted to address and explain the observed inconsistencies in FinFET technology nodes. The controlled variation of geo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f51f5acd9a4889d7e966ed281aaac8b
https://doi.org/10.1109/elnano.2019.8783896
https://doi.org/10.1109/elnano.2019.8783896
